Raman spectroscopy and spreading resistance analysis of phosphorus implanted and annealed silicon

1994 ◽  
Vol 75 (12) ◽  
pp. 8032-8038 ◽  
Author(s):  
Andreas Othonos ◽  
Constantinos Christofides ◽  
Joumana Boussey‐Said ◽  
Michel Bisson
Keyword(s):  
Raman Spectroscopy ◽  
Spreading Resistance ◽  
Resistance Analysis

Diffusion, solubility, and thermodynamic properties of gold in solid germanium studied by means of radiotracer and spreading‐resistance analysis

1991 ◽  
Vol 70 (3) ◽  
pp. 1345-1354 ◽  
Author(s):  
A. Almazouzi ◽  
J. Bernardini ◽  
E. G. Moya ◽  
H. Bracht ◽  
N. A. Stolwijk ◽  
...  
Keyword(s):  
Thermodynamic Properties ◽  
Spreading Resistance ◽  
Resistance Analysis

scholarly journals Micro-Raman and Spreading Resistance Analysis on Beveled Implanted Germanium for Layer Transfer Applications

2011 ◽  
Vol 14 (2) ◽  
pp. H69 ◽  
Author(s):  
Paul Rainey ◽  
Joanna Wasyluk ◽  
Tatiana Perova ◽  
Richard Hurley ◽  
Neil Mitchell ◽  
...  
Keyword(s):  
Layer Transfer ◽  
Spreading Resistance ◽  
Resistance Analysis

Spreading resistance analysis based on the method of regularisation

1993 ◽  
Vol 36 (1) ◽  
pp. 1-11 ◽  
Author(s):  
S.C. Choo ◽  
M.S. Leong ◽  
Y.T. Lee
Keyword(s):  
Spreading Resistance ◽  
Resistance Analysis

Spreading Resistance Analysis of LED by Structure Function

2011 ◽  
Vol 199-200 ◽  
pp. 1501-1504 ◽  
Author(s):  
Dong Jing Liu ◽  
D.G. Yang ◽  
Zhi You ◽  
Feng Ze Hou
Keyword(s):  
Thermal Resistance ◽  
Structure Function ◽  
Experimental Results ◽  
Junction Temperature ◽  
Aluminum Plate ◽  
Resistance Testing ◽  
Effective Solution ◽  
Spreading Resistance ◽  
Resistance Analysis ◽  
The Relationship

In this paper, an investigation on structure function of LED for thermal resistance testing is presented. LED was placed on aluminum plate in different locations. Four group experiments were applied to determine thermal resistance of LED. A simple and effective solution is proposed and discussed on the spreading resistance. The experimental results show the relationship between junction temperature and different locations.

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