Analysis of the scanning electron microscope mirror image based on the dielectric surface microstructure

1994 ◽  
Vol 75 (8) ◽  
pp. 3715-3722 ◽  
Author(s):  
T. Asokan ◽  
T. S. Sudarshan
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dielectric Surface ◽  
Mirror Image ◽  
Surface Microstructure ◽  
Scanning Electron

Temperature effect on dielectric behavior of an industrial porcelain-type ceramic

2009 ◽  
Vol 87 (9) ◽  
pp. 973-980
Author(s):  
O. Hachicha ◽  
N. Ghorbel ◽  
A. Kallel ◽  
Z. Fakhfakh
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Charge Trapping ◽  
Dielectric Behavior ◽  
Mirror Image ◽  
Induced Current ◽  
Physical Mechanisms ◽  
Motion Process ◽  
Influence Of Temperature On ◽  
Scanning Electron

For a better understanding of the physical mechanisms involved in insulators submitted to electron irradiation inside a scanning electron microscope, it is important to investigate charge trapping and detrapping. The commonly used technique to deduce the trapping ability and the motion process of electric charges is based on two complementary experimental methods: the scanning electron microscope mirror effect (SEMME) and the induced current measurement (ICM). In this paper, our study is devoted to the influence of temperature on the behavior of porcelain materials during electron injection time. To evaluate the geometry of the trapped charge distribution, a detailed analysis using the mirror image formation and its evolution is developed.

scholarly journals The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon

2013 ◽  
Vol 15 ◽  
pp. 70-75 ◽  
Author(s):  
Hassan N. Al-Obaidi ◽  
Imad H. Khaleel
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Theoretical Investigation ◽  
Electric Potential ◽  
Mathematical Expression ◽  
Beam Current ◽  
Mirror Image ◽  
Mirror Effect ◽  
Scanning Electron

A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.

Surface Microstructure Study of Self Cured Acrylic Resin after Immersion in Arabica Gayo Coffee

2020 ◽  
Vol 48 ◽  
pp. 62-69
Author(s):  
Viona Diansari ◽  
Subhaini ◽  
Arihta Putri
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Acid Content ◽  
Acrylic Resin ◽  
Polymer Chains ◽  
Surface Microstructure ◽  
Residual Monomer ◽  
Microstructure Observation ◽  
Acrylic Resins ◽  
Scanning Electron

The water absorption on self-cured acrylic resin is higher than the heat cured acrylic resin. Incoming water positions itself between the polymer chains and affects the surface microstructure of self-cured acrylic resin. The absorption of liquids such as Arabica Gayo coffee may aggravate the surface structure of self-cured acrylic resins due to their acid content. This study aims to find out the microstructure of self-cured acrylic resin surface after immersed in Arabica Gayo coffee for 2 and 7 days. This study used 5 specimens of self-cured acrylic resin (MeliodentTM) with size 10x10x1,5 mm3. Each specimen was immersed in aquades for 24 hours to reduce the residual monomer and then be given different immersion treatments. The immersion temperature used was 55°C. After immersion, surface microstructure observation was done using Scanning Electron Microscope (JEOL JSM 6510 LA). The images obtained were bubbles after being immersed in aquades for 2 days and more on day 7, micro porous after being immersed in Arabica Gayo coffee for 2 days and more on day 7 than untreated specimens. The conclusion of this study is micro porous formed more on the surface of self-cured acrylic resin along with the duration of self-cured acrylic resin immersion in Arabica Gayo coffee.

Effects of MgO Addition Level on Microstructure and Wear Resistance of Ni-WC Vacuum Fusion Sintering Coating

2010 ◽  
Vol 154-155 ◽  
pp. 942-945 ◽  
Author(s):  
Ya Nan Wang ◽  
Li Ying Han ◽  
Xiao Da Wang
Keyword(s):  
Wear Resistance ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Base Metal ◽  
Energy Dispersive Spectrometer ◽  
Longitudinal Section ◽  
Surface Microstructure ◽  
Compound Coatings ◽  
Addition Level ◽  
Scanning Electron

Ni-WC-MgO compound coatings were made by way of Vacuum Fusion Sintering (VFS). Effects of MgO addition level on the microstructures of coating surface and longitudinal section, element diffusion in fusion sintering area and wear resistance were analyzed through scanning electron microscope (SEM) and energy dispersive spectrometer (EDS). The results showed as the following: MgO addition made coating and matrix combined closely; there existed obvious transition region. When the addition level of MgO was 0.5%, the coating had the fewest defects and best combination. Ni, Cr, W, C and other elements in the coating diffused to the direction of the base metal while Fe in the base metal diffused to the coating, during which the diffusion of Fe and Ni was most obvious at the junction. Therefore, when the addition level of MgO was 0.5%, the surface microstructure of the coating was the densest and finest, and the wear resistance of the coating was the best.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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