Quantitative control of magnetic ordering in FeRh thin films using 30 keV Ga ion irradiation from a focused ion beam system

2011 ◽  
Vol 109 (7) ◽  
pp. 07E311 ◽  
Author(s):  
K. Aikoh ◽  
S. Kosugi ◽  
T. Matsui ◽  
A. Iwase
Keyword(s):  
Thin Films ◽  
Focused Ion Beam ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Magnetic Ordering ◽  
Beam System

Metallic Nanoneedles Arrays for TEM Sample Preparation “Lift-Out”

2012 ◽  
Author(s):  
Romaneh Jalilian ◽  
David Mudd ◽  
Neil Torrez ◽  
Jose Rivera ◽  
Mehdi M. Yazdanpanah ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Electron Microscope ◽  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam System ◽  
Transmission Electron ◽  
Nanoneedle Array ◽  
Superior Mechanical Properties ◽  
And Performance

Abstract The sample preparation for transmission electron microscope can be done using a method known as "lift-out". This paper demonstrates a method of using a silver-gallium nanoneedle array for a quicker sharpening process of tungsten probes with better sample viewing, covering the fabrication steps and performance of needle-tipped probes for lift-out process. First, an array of high aspect ratio silver-gallium nanoneedles was fabricated and coated to improve their conductivity and strength. Then, the nanoneedles were welded to a regular tungsten probe in the focused ion beam system at the desired angle, and used as a sharp probe for lift-out. The paper demonstrates the superior mechanical properties of crystalline silver-gallium metallic nanoneedles. Finally, a weldless lift-out process is described whereby a nano-fork gripper was fabricated by attaching two nanoneedles to a tungsten probe.

FIB Micromachining and Nano-Structure Fabrication

1999 ◽  
Author(s):  
Raymond A. Lee ◽  
Patrick J. Wolpert
Keyword(s):  
High Precision ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Biological Applications ◽  
Optical Lens ◽  
Nano Structure ◽  
Beam System ◽  
Afm Tips ◽  
Established Technique ◽  
Made In

Abstract FIB Micromachining has long been an established technique, but until recently it has been overshadowed by the more mainstream semiconductor application of the Focused Ion Beam system. Nano- Structure fabrication using the FIB system has become more popular recently due to several factors. The need for sub-micron structures have grown significantly due to a need for enhanced optical and biological applications. Another reason for the growth in micromachining is the improvement made in the ability of FIB systems to produce geometric shapes with high precision. With the latest high-end FIB systems, it is possible to produce microstructures with tens of nano-meters of precision. Optical lens, AFM tips, and nano-apertures are all part of the growing application for FIB Micromachining. This paper will discuss the ability and limitations of the FIB system and some possible application for FIB Micromachining.

Focused ion-beam system for automated MEMS prototyping and processing

1997 ◽  
Author(s):  
Gregory J. Athas ◽  
Kathryn E. Noll ◽  
Russell Mello ◽  
Raymond Hill ◽  
Don E. Yansen ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam System

scholarly journals Effect of Ion Irradiation on Nanoindentation Fracture and Deformation in Silicon Carbide

JOM ◽  
2021 ◽  
Author(s):  
Alexander J. Leide ◽  
Richard I. Todd ◽  
David E. J. Armstrong
Keyword(s):  
Mechanical Properties ◽  
Silicon Carbide ◽  
Residual Stresses ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Resolution Electron ◽  
Radiation Induced ◽  
Compressive Residual Stresses

AbstractSilicon carbide is desirable for many nuclear applications, making it necessary to understand how it deforms after irradiation. Ion implantation combined with nanoindentation is commonly used to measure radiation-induced changes to mechanical properties; hardness and modulus can be calculated from load–displacement curves, and fracture toughness can be estimated from surface crack lengths. Further insight into indentation deformation and fracture is required to understand the observed changes to mechanical properties caused by irradiation. This paper investigates indentation deformation using high-resolution electron backscatter diffraction (HR-EBSD) and Raman spectroscopy. Significant differences exist after irradiation: fracture is suppressed by swelling-induced compressive residual stresses, and the plastically deformed region extends further from the indentation. During focused ion beam cross-sectioning, indentation cracks grow, and residual stresses are modified. The results clarify the mechanisms responsible for the modification of apparent hardness and apparent indentation toughness values caused by the compressive residual stresses in ion-implanted specimens.

The Effect of Radiation Induced Disorder on La0.7Ca0.3MnO3–δ Thin Films

1997 ◽  
Vol 494 ◽  
Author(s):  
R. M. Stroud ◽  
V. M. Browning ◽  
J. M. Byers ◽  
D. B. Chrisey ◽  
W. W. Fuller-Mora ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Irradiation ◽  
Pulsed Laser ◽  
Magnetic Ordering ◽  
Metal Insulator ◽  
Polaron Hopping ◽  
Effects Of Disorder ◽  
Radiation Induced ◽  
Characteristic Relationship ◽  
Peak Resistance

ABSTRACTThe effects of disorder on the transport and magnetic properties of pulsed laser deposited La0.7Ca0.3MnO3 thin films were studied. Ion irradiation with 10 MeV I and 6 MeV Si ions was used to produce controlled levels of defects ranging from 0.006 to 0.024 displacements per atom. The peak resistance temperature of the I-irradiated films decreased from 264K for the undamaged film to OK for the 0.016 dpa film. The magnetic ordering temperature decreased from 270K (undamaged) to 130K (0.011 dpa), and remained nearly constant at 130K for higher damage levels. This demonstrates a decoupling of the magnetic and metal-insulator transitions. A characteristic relationship between the peak resistance temperature and activation energy of resistance with the form Tp = 285(1-Δρ/115)0.13, was observed for all films. This characteristic relationship indicates that the range of resistivity and magnetoresistivity values for observed La0.7Ca0.3MnO3 can be explained in terms of disorder-limited polaron hopping.

Mechanical Properties of Electroplated Copper Thin Films

1999 ◽  
Vol 594 ◽  
Author(s):  
R. Spolenak ◽  
C. A. Volkert ◽  
K. Takahashi ◽  
S. Fiorillo ◽  
J. Miner ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Grain Size ◽  
Film Thickness ◽  
Yield Stress ◽  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Cu Films ◽  
Electroplated Copper

AbstractIt is well known that the mechanical properties of thin films depend critically on film thickness However, the contributions from film thickness and grain size are difficult to separate, because they typically scale with each other. In one study by Venkatraman and Bravman, Al films, which were thinned using anodic oxidation to reduce film thickness without changing grain size, showed a clear increase in yield stress with decreasing film thickness.We have performed a similar study on both electroplated and sputtered Cu films by using chemical-mechanical polishing (CMP) to reduce the film thickness without changing the grain size. Stress-temperature curves were measured for both the electroplated and sputtered Cu films with thicknesses between 0.1 and 1.8 microns using a laser scanning wafer curvature technique. The yield stress at room temperature was found to increase with decreasing film thickness for both sets of samples. The sputtered films, however, showed higher yield stresses in comparison to the electroplated films. Most of these differences can be attributed to the different microstructures of the films, which were determined by focused ion beam (FIB) microscopy and x-ray diffraction.

Strain analysis in MEMS/NEMS structures and devices by using focused ion beam system

2004 ◽  
Vol 111 (1) ◽  
pp. 57-62 ◽  
Author(s):  
Biao Li ◽  
Xiaosong Tang ◽  
Huimin Xie ◽  
Xin Zhang
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Strain Analysis ◽  
Beam System

scholarly journals Ion Irradiation-Induced Microstructural Evolution of Ni–Mo–Cr Low Alloy Steels

Materials ◽  
2018 ◽  
Vol 11 (11) ◽  
pp. 2268
Author(s):  
Hongying Sun ◽  
Penghui Lei ◽  
Guang Ran ◽  
Hui Wang ◽  
Jiyun Zheng ◽  
...  
Keyword(s):  
Irradiation Dose ◽  
Focused Ion Beam ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Strength ◽  
Positron Annihilation Spectroscopy ◽  
Small Scale ◽  
Low Alloy Steels ◽  
Dislocation Loops ◽  
S Parameter

As leading candidates of sheet steels for advanced nuclear reactors, three types of Ni–Mo–Cr high-strength low alloy (HSLA) steels named as CNST1, CNST2 and CNSS3 were irradiated by 400 keV Fe+ with peak fluence to 1.4 × 1014, 3.5 × 1014 and 7.0 × 1014 ions/cm2, respectively. The distribution and morphology of the defects induced by the sample preparation method and Fe+ irradiation dose were investigated by transmission electron microscopy (TEM) and positron-annihilation spectroscopy (PAS). TEM samples were prepared with two methods, i.e., a focused ion beam (FIB) technique and the electroplating and twin-jet electropolishing (ETE) method. Point defects and dislocation loops were observed in CNST1, CNST2 and CNSS3 samples prepared via FIB. On the other hand, samples prepared via the ETE method revealed that a smaller number of defects was observed in CNST1, CNST2 and almost no defects were observed in CNST3. It is indicated that artifact defects could be introduced by FIB preparation. The PAS S-W plots showed that the existence of two types of defects after ion implantation included small-scale defects such as vacancies, vacancy clusters, dislocation loops and large-sized defects. The S parameter of irradiated steels showed a clear saturation in PAS response with increasing Fe+ dose. At the same irradiation dose, higher values of the S-parameter were achieved in CNST1 and CNST2 samples when compared to that in CNSS3 samples. The mechanism and evolution behavior of irradiation-induced defects were analyzed and discussed.

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