Measurement of band offset of a strained‐layer single quantum well by a capacitance‐voltage technique
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1997 ◽
Vol 26
(2)
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pp. L6-L8
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1999 ◽
Vol 28
(8)
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pp. 975-979
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1994 ◽
pp. 399-400
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2013 ◽
Vol 133
(6)
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pp. 1139-1144
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1993 ◽
Vol 11
(3)
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pp. 945
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