Depth‐resolved measurement of lattice relaxation in Ga1−xInxAs/GaAs strained layer superlattices by means of grazing‐incidence x‐ray diffraction

U. Pietsch; H. Metzger; S. Rugel; B. Jenichen; I. K. Robinson

doi:10.1063/1.354724

Depth‐resolved measurement of lattice relaxation in Ga1−xInxAs/GaAs strained layer superlattices by means of grazing‐incidence x‐ray diffraction

Journal of Applied Physics ◽

10.1063/1.354724 ◽

1993 ◽

Vol 74 (4) ◽

pp. 2381-2387 ◽

Cited By ~ 57

Author(s):

U. Pietsch ◽

H. Metzger ◽

S. Rugel ◽

B. Jenichen ◽

I. K. Robinson

Keyword(s):

Lattice Relaxation ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Characterization of Anomalous Lattice-Relaxation Process in InAsP/InGaAsP Strained Layer Superlattices by X-Ray Diffraction Measurements

InP and Related Compounds ◽

10.1201/9781482282986-18 ◽

2000 ◽

pp. 525-580

Keyword(s):

Relaxation Process ◽

Lattice Relaxation ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

Journal of Crystal Growth ◽

10.1016/0022-0248(94)90099-x ◽

1994 ◽

Vol 141 (1-2) ◽

pp. 103-108

Author(s):

X.F. Duan ◽

K.K. Fung ◽

Y.M. Chu

Keyword(s):

Strain State ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Kinematical simulation of high‐resolution x‐ray diffraction curves of GexSi1−x/Si strained‐layer superlattices: A structural assessment

Applied Physics Letters ◽

10.1063/1.99189 ◽

1988 ◽

Vol 52 (14) ◽

pp. 1152-1154 ◽

Cited By ~ 29

Author(s):

J. M. Vandenberg ◽

J. C. Bean ◽

R. A. Hamm ◽

R. Hull

Keyword(s):

High Resolution ◽

X Ray Diffraction ◽

Structural Assessment ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Kinematical Simulation

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Electron and x‐ray diffraction study of ZnTe‐ZnS strained‐layer superlattices grown by molecular beam epitaxy

Applied Physics Letters ◽

10.1063/1.101224 ◽

1989 ◽

Vol 54 (2) ◽

pp. 117-119 ◽

Cited By ~ 8

Author(s):

Takeshi Karasawa ◽

Kazuhiro Ohkawa ◽

Tsuneo Mitsuyu

Keyword(s):

Molecular Beam Epitaxy ◽

Diffraction Study ◽

Molecular Beam ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Approach to an extended X-ray diffraction analysis of strained-layer superlattices

Superlattices and Microstructures ◽

10.1016/0749-6036(91)90324-k ◽

1991 ◽

Vol 10 (3) ◽

pp. 273-277

Author(s):

H. Berger ◽

B. Rosner

Keyword(s):

Diffraction Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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X‐ray diffraction analysis of buffer layer effects on lattice distortions of strained layer superlattices

Journal of Applied Physics ◽

10.1063/1.339831 ◽

1987 ◽

Vol 62 (3) ◽

pp. 1124-1127 ◽

Cited By ~ 6

Author(s):

K. Kamigaki ◽

H. Sakashita ◽

H. Kato ◽

M. Nakayama ◽

N. Sano ◽

...

Keyword(s):

Diffraction Analysis ◽

Buffer Layer ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Lattice Distortions ◽

Strained Layer Superlattices

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Precise thickness measurement within a few monolayers by X-ray diffraction from InGaAs/GaAs strained-layer superlattices

Journal of Crystal Growth ◽

10.1016/0022-0248(95)80263-c ◽

1995 ◽

Vol 150 ◽

pp. 508-512 ◽

Cited By ~ 1

Author(s):

M. Sato ◽

T. Kawaguchi ◽

S. Nishi

Keyword(s):

Thickness Measurement ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices

Ultramicroscopy ◽

10.1016/0304-3991(91)90129-t ◽

1991 ◽

Vol 36 (4) ◽

pp. 375-384 ◽

Cited By ~ 13

Author(s):

X.F. Duan ◽

K.K. Fung

Keyword(s):

Electron Diffraction ◽

Convergent Beam Electron Diffraction ◽

X Ray Diffraction ◽

Beam Electron ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Convergent Beam

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X‐ray‐diffraction analysis of complex structures in ZnCdSe/ZnSe strained‐layer superlattices

Journal of Applied Physics ◽

10.1063/1.357223 ◽

1994 ◽

Vol 76 (9) ◽

pp. 5111-5117 ◽

Cited By ~ 2

Author(s):

Kiichi Nakashima ◽

Yoshihiro Kawaguchi

Keyword(s):

Diffraction Analysis ◽

Complex Structures ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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X‐ray diffraction studies of thermal treatment of GaAs/InGaAs strained‐layer superlattices

Journal of Applied Physics ◽

10.1063/1.335780 ◽

1985 ◽

Vol 58 (9) ◽

pp. 3373-3376 ◽

Cited By ~ 23

Author(s):

M. C. Joncour ◽

M. N. Charasse ◽

J. Burgeat

Keyword(s):

Thermal Treatment ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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