Low temperature electrical characterization of metal‐nitrided oxide‐silicon field effect transistors
1991 ◽
Vol 9
(3)
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pp. 858-862
Keyword(s):
2010 ◽
Vol 10
(10)
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pp. 6779-6782
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2002 ◽
Vol 20
(6)
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pp. 2798
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