Micromagnetic simulations of tunneling stabilized magnetic force microscopy

1993 ◽  
Vol 73 (10) ◽  
pp. 5802-5804 ◽  
Author(s):  
John O. Oti ◽  
Paul Rice
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Micromagnetic Simulations ◽  
Force Microscopy

scholarly journals Skyrmion Formation in Nanodisks Using Magnetic Force Microscopy Tip

Nanomaterials ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 2627
Author(s):  
Mateusz Zelent ◽  
Iuliia V. Vetrova ◽  
Jan Šoltýs ◽  
Xiaoguang Li ◽  
Yan Zhou ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Local Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic State ◽  
Magnetic Domain ◽  
Local Magnetic Field ◽  
Micromagnetic Simulations ◽  
Force Microscopy ◽  
Magnetization State

We demonstrated numerically the skyrmion formation in ultrathin nanodisks using a magnetic force microscopy tip. We found that the local magnetic field generated by the magnetic tip significantly affects the magnetization state of the nanodisks and leads to the formation of skyrmions. Experimentally, we confirmed the influence of the local field on the magnetization states of the disks. Micromagnetic simulations explain the evolution of the magnetic state during magnetic force microscopy scanning and confirm the possibility of skyrmion formation. The formation of the horseshoe magnetic domain is a key transition from random labyrinth domain states into the skyrmion state. We showed that the formation of skyrmions by the magnetic probe is a reliable and repetitive procedure. Our findings provide a simple solution for skyrmion formation in nanodisks.

scholarly journals A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

2021 ◽  
Vol 7 (6) ◽  
pp. 78
Author(s):  
Baha Sakar ◽  
Sibylle Sievers ◽  
Alexander Fernández Scarioni ◽  
Felipe Garcia-Sanchez ◽  
İlker Öztoprak ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Reference Sample ◽  
Image Data ◽  
Stray Field ◽  
Magnetization Distribution ◽  
Finite Width ◽  
Stripe Domain ◽  
Micromagnetic Simulations ◽  
Force Microscopy

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

scholarly journals A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

2021 ◽  
Author(s):  
Baha Sakar ◽  
Sibylle Sievers ◽  
Alexander Fernández Scarioni ◽  
Felipe Garcia-Sanchez ◽  
İlker Öztoprak ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Reference Sample ◽  
Image Data ◽  
Stray Field ◽  
Magnetization Distribution ◽  
Finite Width ◽  
Stripe Domain ◽  
Micromagnetic Simulations ◽  
Force Microscopy

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack which shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process combined with a characterization of the sample micromagnetic parameters allows to reliably calculate the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Small ◽  
2020 ◽  
Vol 16 (11) ◽  
pp. 2070058
Author(s):  
Héctor Corte‐León ◽  
Volker Neu ◽  
Alessandra Manzin ◽  
Craig Barton ◽  
Yuanjun Tang ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Magnetic Domain Observation on Melt-Spun Nd-Fe-B Ribbons Using Magnetic Force Microscopy

1999 ◽  
Vol 577 ◽  
Author(s):  
A. Gavrin ◽  
C. Sellers ◽  
S.H. Liouw
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Measurements ◽  
Magnetic Domain ◽  
Domain Size ◽  
High Coercivity ◽  
Uniform Domain ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Melt Spun

ABSTRACTWe have used Magnetic Force Microscopy (MFM) to study the magnetic domain structures of melt-spun Nd-Fe-B ribbons. The ribbons are commercial products (Magnequench International, Inc. MQP-B and MQP-B+) with a thickness of approximately 20 microns. These materials have identical composition, Nd12.18B5.36Fe76.99Co5.46, but differ in quenching conditions. In order to study the distribution of domain sizes through the ribbon thickness, we have prepared cross-sectional samples in epoxy mounts. In order to avoid artifacts due to tip-sample interactions, we have used high coercivity CoPt coated MFM tips. Our studies show domain sizes typically ranging from 50-200 nm in diameter. This is in agreement with studies of similar materials in which domains were investigated in the plane of the ribbon. We also find that these products differ substantially in mean domain size and in the uniformity of the domain sizes as measured across the ribbon. While the B+ material shows nearly uniform domain sizes throughout the cross section, the B material shows considerably larger domains on one surface, followed by a region in which the domains are smaller than average. This structure is presumably due to the differing quench conditions. The region of coarse domains varies in thickness, disappearing in some areas, and reaching a maximum thickness of 2.75 µm in others. We also describe bulk magnetic measurements, and suggest that.

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