Transmission electron microscopy and scanning transmission electron microscope analysis of the effects of thermal processing on the structural integrity of GaInAs/GaInAsP multilayers

1993 ◽  
Vol 73 (9) ◽  
pp. 4297-4304 ◽  
Author(s):  
R. E. Mallard ◽  
N. J. Long ◽  
E. J. Thrush ◽  
K. Scarrott ◽  
A. G. Norman ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Thermal Processing ◽  
Structural Integrity ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Transmission Electron Microscope Analysis ◽  
Electron Microscope Analysis

Development of 200 kV Scanning-Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 410-411
Author(s):  
H. Koike ◽  
S. Sakurai ◽  
K. Ueno ◽  
M. Watanabe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
The Other ◽  
Morphological Observation ◽  
Magnetic Domains ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Backscattered Electron ◽  
Increasing Demand

In recent years, there has been increasing demand for higher voltage SEMs, in the field of surface observation, especially that of magnetic domains, dislocations, and electron channeling patterns by backscattered electron microscopy. On the other hand, the resolution of the CTEM has now reached 1 ∼ 2Å, and several reports have recently been made on the observation of atom images, indicating that the ultimate goal of morphological observation has beem nearly achieved.

On-Line Aberration Measurement and Correction in STEM

1997 ◽  
Vol 3 (S2) ◽  
pp. 1171-1172 ◽  
Author(s):  
Ondrej L. Krivanek ◽  
Niklas Dellby ◽  
Andrew J. Spence ◽  
Roger A. Camps ◽  
L. Michael Brown
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Spherical Aberration ◽  
Computer Control ◽  
Beam Current ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron ◽  
Probe Size ◽  
Scanning Transmission ◽  
On Line

Aberration correction in electron microscopy is a subject with a 60 year history dating back to the fundamental work of Scherzer. There have been several partial successes, such as Deltrap's spherical aberration (Cs) corrector which nulled Cs over 30 years ago. However, the practical goal of attaining better resolution than the best uncorrected microscope operating at the same voltage remains to be fulfilled. Combining well-known electron-optical principles with stable electronics, versatile computer control, and software able to diagnose and correct aberrations on-line is at last bringing this goal within reach.We are building a quadrupole-octupole Cs corrector with automated aberration diagnosis for a VG HB5 dedicated scanning transmission electron microscope (STEM). A STEM with no spherical aberration will produce a smaller probe size with a given beam current than an uncorrected STEM, and a larger beam current in a given size probe.

scholarly journals Improved contrast in cytochemistry of dehydrogenases by scanning transmission electron microscopy.

1981 ◽  
Vol 29 (5) ◽  
pp. 678-681 ◽  
Author(s):  
W Deimann ◽  
R Freeman ◽  
H D Fahimi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Osmium Tetroxide ◽  
Lactic Dehydrogenase ◽  
Scanning Transmission Electron Microscope ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Tissue Contrast ◽  
Stem Image

A scanning transmission electron microscope (STEM) was used to examine ultrathin sections of rabbit white skeletal muscle. Lactic dehydrogenase (LDH) activity was localized in the tissue using the tetra-nitro blue tetrazolium (TNBT) method. For most specimens postfixation was omitted in order to avoid reoxidation and solubilization of the formazan by osmium tetroxide. The STEM image revealed sufficient contrast of the intracellular structures and apparently electron-dense reaction product in the sarcoplasmic reticulum and mitochondria. Substantially less contrast was obtained when the same areas were observed by conventional transmission electron microscopy (CTEM). In material postfixed with osmium tetroxide, although the tissue contrast was improved, the TNBT reaction product was focally leached out, exhibiting lower contrast than in unosmicated sections. These results indicate that the fine structural visualization of dehydrogenases with TNBT, the STEM technique as used in the present study is superior to that obtained by CTEM.

A Comparison of Calculated Images Generated by Six Modes of Transmission Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 368-369
Author(s):  
A. Engel ◽  
J. W. Wiggins ◽  
David Woodruff
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Phase Plate ◽  
Modes Of Transmission ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Detector ◽  
Conventional Electron Microscopy

Six modes of transmission electron microscopy are compared by a numerical simulation of the image formation assuming perfectly coherent illumination and ignoring the influence of radiation damage and noise. The comparison includes five modes of conventional electron microscopy (CEM): axial bright field, Unwin's phase plate, central stop dark field, tilted-beam dark field and conical illumination dark field, and the annular detector mode of the scanning transmission electron microscope (STEM).

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