Observation by conductive-probe atomic force microscopy of strongly inverted surface layers at the hydrogenated amorphous silicon/crystalline silicon heterojunctions

2010 ◽  
Vol 97 (25) ◽  
pp. 252110 ◽  
Author(s):  
O. A. Maslova ◽  
J. Alvarez ◽  
E. V. Gushina ◽  
W. Favre ◽  
M. E. Gueunier-Farret ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amorphous Silicon ◽  
Crystalline Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Surface Layers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Silicon Heterojunctions ◽  
Hydrogenated Amorphous

Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy

2003 ◽  
Vol 83 (9) ◽  
pp. 1764-1766 ◽  
Author(s):  
B. Rezek ◽  
T. Mates ◽  
J. Stuchlı́k ◽  
J. Kočka ◽  
A. Stemmer
Keyword(s):  
Atomic Force Microscopy ◽  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Charge Storage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hydrogenated Amorphous

scholarly journals High quality crystalline silicon surface passivation by combined intrinsic and n-type hydrogenated amorphous silicon

2011 ◽  
Vol 99 (20) ◽  
pp. 203503 ◽  
Author(s):  
Jan-Willem A. Schüttauf ◽  
Karine H. M. van der Werf ◽  
Inge M. Kielen ◽  
Wilfried G. J. H. M. van Sark ◽  
Jatindra K. Rath ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Silicon Surface ◽  
Surface Passivation ◽  
Crystalline Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
High Quality ◽  
Hydrogenated Amorphous ◽  
Silicon Surface Passivation
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