A secondary‐ion‐mass‐spectrometry study of low‐energy ion‐beam mixing of Au‐Pt interfaces
1986 ◽
Vol 13
(4)
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pp. 277-279
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1999 ◽
Vol 144-145
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pp. 292-296
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1997 ◽
Vol 15
(6)
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pp. 3127-3133
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1984 ◽
Vol 80
(7)
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pp. 1903
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2016 ◽
Vol 321
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pp. 241-247
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1991 ◽
Vol 59-60
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pp. 116-119
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