Evaluation of In1−xGaxAs/In1−yGayAs strained layer superlattice structures by x‐ray diffraction measurements with a novel discrimination method of the fundamental peak

1992 ◽  
Vol 71 (3) ◽  
pp. 1189-1195 ◽  
Author(s):  
Kiichi Nakashima
1993 ◽  
Vol 26 (6) ◽  
pp. 801-811 ◽  
Author(s):  
R. Zaus

X-ray diffraction rocking curves of a strained-layer superlattice structure have been measured at symmetric and asymmetric Bragg reflections and compared with simulated diffraction curves. The calculations are based on dynamical scattering theory. The experimental and theoretical curves exhibit a discrepancy with regard to the angular position of the higher-order satellite reflections, which can be removed by introducing a new expression for the deviation parameter in the dynamical diffraction theory. The improved deviation parameter extends the range of validity of the two-beam approximation, especially for asymmetric reflections with glancing exit geometry. Therefore, if the relaxation of strained-layer heterostructures is to be determined by comparison with simulated rocking curves, only the improved parameter should be used.


1992 ◽  
Vol 7 (5) ◽  
pp. 627-631 ◽  
Author(s):  
A R Powell ◽  
D K Bowen ◽  
M Wormington ◽  
R A Kubiak ◽  
E H C Parker ◽  
...  

2011 ◽  
Vol 67 (5) ◽  
pp. 409-415 ◽  
Author(s):  
Kevin H. Stone ◽  
Dayna L. Turner ◽  
Mayank Pratap Singh ◽  
Thomas P. Vaid ◽  
Peter W. Stephens

The crystal structures of the isostructural title compounds poly[(μ-benzene-1,4-dithiolato)dithallium], Tl2(SC6H4S), and poly[(μ-benzene-1,4-diselenolato)dithallium], Tl2(SeC6H4Se), were solved by simulated annealing from high-resolution synchrotron X-ray powder diffraction. Rietveld refinements of an initial structure with one formula unit per triclinic cell gave satisfactory agreement with the data, but led to a structure with impossibly close non-bonded contacts. A disordered model was proposed to alleviate this problem, but an alternative supercell structure leads to slightly improved agreement with the data. The isostructural superlattice structures were confirmed for both compounds through additional data collection, with substantially better counting statistics, which revealed the presence of very weak superlattice peaks not previously seen. Overall, each structure contains Tl—S or Tl—Se two-dimensional networks, connected by phenylene bridges. The sulfur (or selenium) coordination sphere around each thallium is a highly distorted square pyramid or a `see-saw' shape, depending upon how many Tl—S or Tl—Se interactions are considered to be bonds. In addition, the two compounds contain pairs of TlI ions that interact through a closed-shell `thallophilic' interaction: in the sulfur compound there are two inequivalent pairs of Tl atoms with Tl—Tl distances of 3.49 and 3.58 Å, while in the selenium compound those Tl—Tl interactions are at 3.54 and 3.63 Å.


1989 ◽  
Vol 33 ◽  
pp. 61-66 ◽  
Author(s):  
Mary A. G. Halliwell

Many advanced semiconductor device designs require the growth of heteroepitaxial layers with lattice parameters differing by up to a few percent with respect to the substrate. X-ray diffraction offers a nondestructive method of determining the extent of relaxation. This paper discusses the sensitivity of x-ray techniques to small amounts of relaxation, describes how relaxation is measured in cubic materials for layer on (001) substrates and suggests nomenclature for the case of asymmetric relaxation.


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