Measurement of thermal properties of thin films up to high temperatures—Pulsed photothermal radiometry system and Si–B–C–N films

2010 ◽  
Vol 81 (12) ◽  
pp. 124902 ◽  
Author(s):  
J. Martan ◽  
J. Čapek ◽  
E. Amin Chalhoub
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
High Temperatures ◽  
Photothermal Radiometry ◽  
Pulsed Photothermal Radiometry

Thermal Characterization of Tungsten Thin Films by Pulsed Photothermal Radiometry

2006 ◽  
Vol 10 (4) ◽  
pp. 333-344 ◽  
Author(s):  
J. Martan ◽  
N. Semmar ◽  
C. Boulmer-Leborgne ◽  
P. Plantin ◽  
E. Le Menn
Keyword(s):  
Thin Films ◽  
Thermal Characterization ◽  
Photothermal Radiometry ◽  
Pulsed Photothermal Radiometry

Electro-mechanical properties of multilayered aluminum nitride and platinum thin films at high temperatures

2019 ◽  
Vol 293 ◽  
pp. 128-135 ◽  
Author(s):  
P. Schmid ◽  
F. Triendl ◽  
C. Zarfl ◽  
S. Schwarz ◽  
W. Artner ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Aluminum Nitride ◽  
High Temperatures

scholarly journals Linear magnetoresistance in topological insulator thin films: Quantum phase coherence effects at high temperatures

2013 ◽  
Vol 102 (1) ◽  
pp. 012102 ◽  
Author(s):  
B. A. Assaf ◽  
T. Cardinal ◽  
P. Wei ◽  
F. Katmis ◽  
J. S. Moodera ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperatures ◽  
Topological Insulator ◽  
Phase Coherence ◽  
Quantum Phase ◽  
Coherence Effects ◽  
Linear Magnetoresistance
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