Structural characterization of CdS epilayers by channeling Rutherford backscattering spectrometry

1991 ◽  
Vol 70 (4) ◽  
pp. 2041-2045 ◽  
Author(s):  
G. Leo ◽  
A. V. Drigo ◽  
N. Lovergine ◽  
A. M. Mancini
Keyword(s):  
Structural Characterization ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering

Characterization of amorphous silicon films by Rutherford backscattering spectrometry

1980 ◽  
Vol 168 (1-3) ◽  
pp. 211-215 ◽  
Author(s):  
K. Kubota ◽  
T. Imura ◽  
M. Iwami ◽  
A. Hiraki ◽  
M. Satou ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Silicon Films

Structural characterization of AlGaN/GaN superlattices by x-ray diffraction and Rutherford backscattering

2006 ◽  
Vol 40 (3) ◽  
pp. 137-143 ◽  
Author(s):  
Shengqiang Zhou ◽  
M.F. Wu ◽  
S.D. Yao ◽  
B.S. Zhang ◽  
H. Yang
Keyword(s):  
Structural Characterization ◽  
Rutherford Backscattering ◽  
X Ray Diffraction ◽  
X Ray
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