Rutherford backscattering spectrometry characterization of nanoporous chalcogenide thin films grown at oblique angles

2008 ◽  
Vol 23 (7) ◽  
pp. 981 ◽  
Author(s):  
R. J. Martín-Palma ◽  
A. Redondo-Cubero ◽  
R. Gago ◽  
J. V. Ryan ◽  
C. G. Pantano
Keyword(s):  
Thin Films ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Chalcogenide Thin Films

Selective wet-etching and characterization of chalcogenide thin films in inorganic alkaline solutions

2007 ◽  
Vol 353 (13-15) ◽  
pp. 1441-1445 ◽  
Author(s):  
J. Orava ◽  
T. Wagner ◽  
M. Krbal ◽  
T. Kohoutek ◽  
Mil. Vlcek ◽  
...  
Keyword(s):  
Thin Films ◽  
Wet Etching ◽  
Alkaline Solutions ◽  
Chalcogenide Thin Films

Preparation and characterization of laser-ablated multicomponent chalcogenide thin films

1990 ◽  
Vol 5 (3) ◽  
pp. 511-514 ◽  
Author(s):  
Didarul Islam ◽  
C. E. Brient ◽  
R. L. Cappelletti
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Thermal Evaporation ◽  
Analytical Techniques ◽  
X Rays ◽  
Single Source ◽  
X Ray ◽  
Chalcogenide Thin Films ◽  
Scanning Electron

The preparation of multicomponent chalcogenide glassy thin films from bulk targets by laser ablation is described. The film stoichiometries are characterized by proton-induced x-ray emission (PIXE). Compared to single source thermal evaporation, laser ablation is found to preserve starting stoichiometries in the resulting thin films far more accurately. Thermally evaporated films were studied both by PIXE and by energy dispersed x rays (EDX) produced in a scanning electron microscope, and the results of these two analytical techniques compare well.

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