In situ observation of the strain of Co and Ni deposited on Pd (111) by reflection high energy electron diffraction

T. Yamazaki; Y. Suzuki; T. Katayama; M. Taninaka; K. Nakagawa; A. Itoh

doi:10.1063/1.349300

In situ observation of the strain of Co and Ni deposited on Pd (111) by reflection high energy electron diffraction

Journal of Applied Physics ◽

10.1063/1.349300 ◽

1991 ◽

Vol 70 (6) ◽

pp. 3180-3183 ◽

Cited By ~ 21

Author(s):

T. Yamazaki ◽

Y. Suzuki ◽

T. Katayama ◽

M. Taninaka ◽

K. Nakagawa ◽

...

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron

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In situ observation of low temperature growth of crystalline silicon using reflection high-energy electron diffraction

Journal of Non-Crystalline Solids ◽

10.1016/s0022-3093(99)00730-9 ◽

2000 ◽

Vol 266-269 ◽

pp. 64-68 ◽

Cited By ~ 16

Author(s):

T Kitagawa ◽

M Kondo ◽

A Matsuda

Keyword(s):

Electron Diffraction ◽

Low Temperature ◽

Crystalline Silicon ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

Temperature Growth ◽

Low Temperature Growth

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In situ observation of growing surface of oxide films by reflection high‐energy electron diffraction beam excited Auger electron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578625 ◽

1993 ◽

Vol 11 (5) ◽

pp. 2676-2680 ◽

Cited By ~ 3

Author(s):

Hidehiko Nonaka ◽

Takashi Shimizu ◽

Shingo Ichimura ◽

Kazuo Arai

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxide Films ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron

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Reactive Deposition Epitaxial Growth of β-FeSi 2 Film on Si(001): in situ Observation by Reflective High Energy Electron Diffraction

Chinese Physics Letters ◽

10.1088/0256-307x/12/10/010 ◽

1995 ◽

Vol 12 (10) ◽

pp. 613-616 ◽

Cited By ~ 1

Author(s):

Wang Lianwei ◽

Lin Chenglu ◽

Shen Qinwo ◽

Li Rushan ◽

Zou Shichang

Keyword(s):

Electron Diffraction ◽

Epitaxial Growth ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

Reactive Deposition

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In situ observation of low temperature growth of Ge on Si(1 1 1) by reflection high energy electron diffraction

Applied Surface Science ◽

10.1016/j.apsusc.2016.02.144 ◽

2016 ◽

Vol 370 ◽

pp. 40-48 ◽

Cited By ~ 7

Author(s):

Andreas Grimm ◽

Andreas Fissel ◽

Eberhard Bugiel ◽

Tobias F. Wietler

Keyword(s):

Electron Diffraction ◽

Low Temperature ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

Temperature Growth ◽

Low Temperature Growth

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In situ observation of reflection high-energy electron diffraction during the initial growth of SiC on Si using dimethylsilane

Journal of Crystal Growth ◽

10.1016/s0022-0248(01)02231-x ◽

2002 ◽

Vol 237-239 ◽

pp. 1254-1259 ◽

Cited By ~ 8

Author(s):

Kanji Yasui ◽

Yuzuru Narita ◽

Toshikazu Inubushi ◽

Tadashi Akahane

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

Initial Growth ◽

High Energy Electron

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In situ observation of the growing surface of YBa2Cu3O7−δ films by reflection high-energy electron diffraction beam excited AES

Physica C Superconductivity ◽

10.1016/0921-4534(93)90330-s ◽

1993 ◽

Vol 217 (3-4) ◽

pp. 280-286 ◽

Cited By ~ 3

Author(s):

Hidehiko Nonaka ◽

Takashi Shimizu ◽

Kazuo Arai

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron

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Reactive deposition epitaxial growth of β‐FeSi2 film on Si(111): In situ observation by reflective high energy electron diffraction

Applied Physics Letters ◽

10.1063/1.113385 ◽

1995 ◽

Vol 66 (25) ◽

pp. 3453-3455 ◽

Cited By ~ 16

Author(s):

Lianwei Wang ◽

Chenglu Lin ◽

Qinwo Shen ◽

Xian Lin ◽

Rushan Ni ◽

...

Keyword(s):

Electron Diffraction ◽

Epitaxial Growth ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

Reactive Deposition

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In situ observation of the growth process of the InAsGaAs heteroepitaxial system using scanning microprobe reflection high energy electron diffraction-total reflection angle X-ray spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(93)90554-3 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 18-22 ◽

Cited By ~ 2

Author(s):

S. Shimizu ◽

K. Yamamuro ◽

K. Fuwa ◽

H. Yanagida ◽

H. Yamakawa ◽

...

Keyword(s):

Electron Diffraction ◽

Growth Process ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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In-situ characterization of II/VI molecular beam epitaxy growth using reflection high-energy electron diffraction oscillations

Journal of Crystal Growth ◽

10.1016/0022-0248(94)91270-x ◽

1994 ◽

Vol 137 (1-2) ◽

pp. 187-194 ◽

Cited By ~ 12

Author(s):

J.M. Gaines

Keyword(s):

Molecular Beam Epitaxy ◽

Electron Diffraction ◽

Molecular Beam ◽

High Energy ◽

Energy Electron ◽

Molecular Beam Epitaxy Growth ◽

High Energy Electron ◽

In Situ Characterization

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Reflection high-energy electron diffraction during substrate rotation: A new dimension for in situ characterization

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589976 ◽

1998 ◽

Vol 16 (3) ◽

pp. 1507 ◽

Cited By ~ 32

Author(s):

W. Braun

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

In Situ Characterization ◽

Substrate Rotation

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