In situ observation of low temperature growth of Ge on Si(1 1 1) by reflection high energy electron diffraction

2016 ◽  
Vol 370 ◽  
pp. 40-48 ◽  
Author(s):  
Andreas Grimm ◽  
Andreas Fissel ◽  
Eberhard Bugiel ◽  
Tobias F. Wietler
1991 ◽  
Vol 70 (6) ◽  
pp. 3180-3183 ◽  
Author(s):  
T. Yamazaki ◽  
Y. Suzuki ◽  
T. Katayama ◽  
M. Taninaka ◽  
K. Nakagawa ◽  
...  

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