Superresolution confocal technology for displacement measurements based on total internal reflection

2010 ◽  
Vol 81 (10) ◽  
pp. 103702 ◽  
Author(s):  
Cuifang Kuang ◽  
M. Yakut Ali ◽  
Xiang Hao ◽  
Tingting Wang ◽  
Xu Liu
2020 ◽  
pp. 44-49
Author(s):  
I. N. Pavlov

Two optical methods, namely surface plasmon resonance imaging and frustrated total internal reflection, are described in the paper in terms of comparing their sensitivity to change of refractive index of a thin boundary layer of an investigated medium. It is shown that, despite the fact that the theoretically calculated sensitivity is higher for the frustrated total internal reflection method, and the fact that usually in practice the surface plasmon resonance method, on the contrary, is considered more sensitive, under the same experimental conditions both methods show a similar result.


Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan

Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan

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