Combining Atomic Force Microscopy with Polarized Raman Microscopy

2010 ◽  
Author(s):  
Juergen Sawatzki ◽  
Carsten Wehlack ◽  
Wulff Possart ◽  
Andrea Thoene ◽  
Matthias Hannss ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Raman Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polarized Raman

Pushing the limit of confocal polarized Raman microscopy

2007 ◽  
Vol 85 (10) ◽  
pp. 806-815 ◽  
Author(s):  
François Lagugné-Labarthet
Keyword(s):  
Review Paper ◽  
Polarized Light ◽  
Raman Microscopy ◽  
Polymer Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Results ◽  
Polarized Raman ◽  
Orientation Parameters

Raman microscopy has emerged as a powerful technique to characterize anisotropic materials with sub micro meter resolution. The use of polarized light allows one to obtain precise information about the local organization of the relevant molecular groups through the determination of the most probable distribution function. Such polarization analysis can be conducted under a confocal microscope, but caution must be exercised because of the use of objectives of high numerical value. The molecular orientation can be effectively correlated with the topography of the sample when atomic force microscopy experiments are conducted on the same object. In the present review paper, we present Raman imaging results that have been conducted on mesostructured polymer surfaces and on a single isolated semiconductor nanowire.Key words: Raman spectroscopy, confocal microscopy, orientation parameters, azopolymers, nanowires.

scholarly journals Imaging of surface acoustic waves on GaAs using 2D confocal Raman microscopy and atomic force microscopy

2021 ◽  
Vol 118 (3) ◽  
pp. 031602
Author(s):  
Brian Douglas Rummel ◽  
Leonid Miroshnik ◽  
Marios Patriotis ◽  
Andrew Li ◽  
Talid R. Sinno ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Acoustic Waves ◽  
Surface Acoustic Waves ◽  
Raman Microscopy ◽  
Confocal Raman Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Confocal Raman

scholarly journals Statistical Raman Microscopy and Atomic Force Microscopy on Heterogeneous Graphene Obtained after Reduction of Graphene Oxide

2014 ◽  
Vol 118 (14) ◽  
pp. 7698-7704 ◽  
Author(s):  
Siegfried Eigler ◽  
Ferdinand Hof ◽  
Michael Enzelberger-Heim ◽  
Stefan Grimm ◽  
Paul Müller ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Raman Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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