Noncontact minority‐carrier lifetime measurement at elevated temperatures for metal‐doped Czochralski silicon crystals
2015 ◽
Vol 32
(10)
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pp. 107303
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1985 ◽
Vol 20
(4)
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pp. 485-489
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2001 ◽
Vol 9
(6)
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pp. 417-424
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