Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]

R. Shikler; Y. Rosenwaks

doi:10.1063/1.3431744

Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]

Applied Physics Letters ◽

10.1063/1.3431744 ◽

2010 ◽

Vol 96 (21) ◽

pp. 216102

Author(s):

R. Shikler ◽

Y. Rosenwaks

Keyword(s):

Direct Measurement ◽

Diffusion Length ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Minority Carriers

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Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.125039 ◽

1999 ◽

Vol 75 (16) ◽

pp. 2435-2437 ◽

Cited By ~ 42

Author(s):

T. Meoded ◽

R. Shikler ◽

N. Fried ◽

Y. Rosenwaks

Keyword(s):

Direct Measurement ◽

Diffusion Length ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Minority Carriers

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Comment on “Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy” [Appl. Phys. Lett. 75, 2435 (1999)]

Applied Physics Letters ◽

10.1063/1.3431743 ◽

2010 ◽

Vol 96 (21) ◽

pp. 216101 ◽

Cited By ~ 1

Author(s):

Mohammed Shahriar Sabuktagin

Keyword(s):

Direct Measurement ◽

Diffusion Length ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Minority Carriers

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Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.3264081 ◽

2009 ◽

Vol 95 (19) ◽

pp. 191908 ◽

Cited By ~ 16

Author(s):

Masaki Takihara ◽

Takuji Takahashi ◽

Toru Ujihara

Keyword(s):

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Kelvin Probe Force Microscopy ◽

Multicrystalline Silicon ◽

Silicon Solar Cells ◽

Kelvin Probe ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Force Microscopy

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Direct Measurement of Transfer Functions in Kelvin Probe Force Microscopy Using Artificially Patterned Surface Potentials

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.5630 ◽

2008 ◽

Vol 47 (7) ◽

pp. 5630-5635 ◽

Cited By ~ 4

Author(s):

Kazunari Ozasa ◽

Shigeyuki Nemoto ◽

Takashi Isoshima ◽

Eisuke Ito ◽

Mizuo Maeda ◽

...

Keyword(s):

Direct Measurement ◽

Transfer Functions ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Patterned Surface ◽

Surface Potentials

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Cited By ~ 3

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Real Space ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Cited By ~ 26

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Cited By ~ 1

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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