Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy

1999 ◽  
Vol 75 (16) ◽  
pp. 2435-2437 ◽  
Author(s):  
T. Meoded ◽  
R. Shikler ◽  
N. Fried ◽  
Y. Rosenwaks
Keyword(s):  
Direct Measurement ◽  
Diffusion Length ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Minority Carriers

Direct Measurement of Transfer Functions in Kelvin Probe Force Microscopy Using Artificially Patterned Surface Potentials

2008 ◽  
Vol 47 (7) ◽  
pp. 5630-5635 ◽  
Author(s):  
Kazunari Ozasa ◽  
Shigeyuki Nemoto ◽  
Takashi Isoshima ◽  
Eisuke Ito ◽  
Mizuo Maeda ◽  
...  
Keyword(s):  
Direct Measurement ◽  
Transfer Functions ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Patterned Surface ◽  
Surface Potentials
Sign in / Sign up

Export Citation Format

Share Document