The effect of molecular‐beam‐epitaxial growth conditions on the electrical characteristics of In0.52Al0.48As/In0.53Ga0.47As resonant tunneling diodes
1987 ◽
Vol 5
(3)
◽
pp. 771
◽
1995 ◽
Vol 150
◽
pp. 755-759
◽
1997 ◽
Vol 175-176
◽
pp. 883-887
◽
2011 ◽
Vol 334
(1)
◽
pp. 113-117
◽
2000 ◽
Vol 208
(1-4)
◽
pp. 93-99
◽
1993 ◽
Vol 68
(2)
◽
pp. 203-207
◽