Quantifying electronic charge trap states and the effect of imprint on ferroelectric poly(vinylidene fluoride-trifluoroethylene) thin films

2010 ◽  
Vol 107 (10) ◽  
pp. 104110 ◽  
Author(s):  
Connie Lew ◽  
Michael O. Thompson
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Electronic Charge ◽  
Trap States ◽  
Charge Trap ◽  
Poly Vinylidene Fluoride

Quantifying the Role of Electronic Charge Trap States on Imprint Behavior in Ferroelectric Poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) Thin Films

2004 ◽  
Vol 830 ◽  
Author(s):  
Connie Lew ◽  
Michael O. Thompson
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Time Frame ◽  
Temperature Cycling ◽  
Electronic Charge ◽  
Trap States ◽  
Charge Trap ◽  
Si Substrates ◽  
Heating And Cooling ◽  
Poly Vinylidene Fluoride

ABSTRACTPoly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) ferroelectric thin films are a potentially promising material for sensors or non-volatile memories. Imprint, the time-dependent resistance to polarization reversal, is a key material property that limits applications and is poorly understood. Based on experimental time and temperature dependences, we propose and investigate the link between imprint and charge trap states. A novel fast-ramp thermally stimulated current (TSC) measurement was developed to quantify and characterize the traps in an appropriate time-frame.Thin films of P(VDF-TrFE) on oxidized Si substrates were characterized following controlled initialization, fatigue, polarization, and imprint. Trap states were thermally filled/emptied by temperature cycling between 20–100 °C, using heating and cooling rates between 1 and 5 °C/s. Dynamics of this fast-ramp TSC indicate the presence of not only trap states, but also reversible and non-reversible charge accumulation. The presence of electrically active traps were verified by measurements over 1–10 s imprint times. Trapped charge directly correlated with the log of the imprint time, with a rate of ∼0.12 /μC/cm2/decade.

Effect of Interface and Crystallinity on the Ferroelectric Properties of Poly(Vinylidene Fluoride-Trifluoroethylene) Copolymer Thin Films

2001 ◽  
Vol 665 ◽  
Author(s):  
Feng Xia ◽  
H.S. Xu ◽  
Babak Razavi ◽  
Q. M. Zhang
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Ferroelectric Properties ◽  
Large Change ◽  
Thickness Dependence ◽  
Dielectric Measurement ◽  
Switching Speed ◽  
Wide Range ◽  
Poly Vinylidene Fluoride ◽  
Polarization Level

ABSTRACTFerroelectric polymer thin films are attractive for a wide range of applications such as MEMS, IR sensors, and memory devices. We present the results of a recent investigation on the thickness dependence of the ferroelectric properties of poly(vinylidene fluoridetrifluoroethylene) copolymer spin cast films on electroded Si substrate. We show that as the film thickness is reduced, there exist two thickness regions. For films at thickness above 100 nm, the thickness dependence of the ferroelectric properties can be attributed to the interface effect. However, for thinner films, there is a large change in the ferroelectric properties such as the polarization level, the coercive field, and polarization switching speed, which is related to the large drop of the crystallinity in the ultrathin film region (below 100 nm). The results from Xray, dielectric measurement, and AFM all indicate that there is a threshold thickness at about 100 nm below which the crystallinity in the film reduces abruptly.

Residual stress in piezoelectric poly(vinylidene-fluoride-co-trifluoroethylene) thin films deposited on silicon substrates

2010 ◽  
Vol 519 (4) ◽  
pp. 1441-1444 ◽  
Author(s):  
Sharon Roslyn Oh ◽  
Kui Yao ◽  
Choi Lan Chow ◽  
Francis Eng Hock Tay
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Vinylidene Fluoride ◽  
Silicon Substrates ◽  
Poly Vinylidene Fluoride

scholarly journals Heterogeneous freezing on pyroelectric poly(vinylidene fluoride‐co‐trifluoroethylene) thin films

2020 ◽  
Vol 52 (12) ◽  
pp. 1150-1155
Author(s):  
Sabine Apelt ◽  
Susanne Höhne ◽  
Petra Uhlmann ◽  
Ute Bergmann
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Poly Vinylidene Fluoride

scholarly journals Revisiting the δ-phase of poly(vinylidene fluoride) for solution-processed ferroelectric thin films

2013 ◽  
Vol 12 (5) ◽  
pp. 433-438 ◽  
Author(s):  
Mengyuan Li ◽  
Harry J. Wondergem ◽  
Mark-Jan Spijkman ◽  
Kamal Asadi ◽  
Ilias Katsouras ◽  
...  
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Ferroelectric Thin Films ◽  
Solution Processed ◽  
Poly Vinylidene Fluoride ◽  
Δ Phase

scholarly journals Spin cast ferroelectric beta poly(vinylidene fluoride) thin films via rapid thermal annealing

2008 ◽  
Vol 92 (1) ◽  
pp. 012921 ◽  
Author(s):  
Seok Ju Kang ◽  
Youn Jung Park ◽  
Jinwoo Sung ◽  
Pil Sung Jo ◽  
Cheolmin Park ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Vinylidene Fluoride ◽  
Poly Vinylidene Fluoride
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