Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

2010 ◽  
Vol 96 (18) ◽  
pp. 183107 ◽  
Author(s):  
L. Fumagalli ◽  
G. Gramse ◽  
D. Esteban-Ferrer ◽  
M. A. Edwards ◽  
G. Gomila
Keyword(s):  
Dielectric Constant ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Mapping the local dielectric constant of a bio‑nanostructured system

2020 ◽  
Author(s):  
Wescley Walison Valeriano ◽  
Rodrigo Ribeiro Andrade ◽  
Juan Pablo Vasco ◽  
Angelo Malachias ◽  
Bernardo Ruegger Almeida Neves ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Cross Section ◽  
Structural Information ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Visible Range ◽  
Force Microscopy ◽  
Measured Profile ◽  
Amazonian Rainforest ◽  
Reflectance Measurements

  The aim of this work is to determine the dielectric constant value of a bio-nanostructured system via Electrostatic Force Microscopy (EFM) and to show how this method is useful to study natural photonic crystals. We mapped the dielectric constant of the cross-section of the posterior wing of the damselfly Chalcopteryx rutilans with nanometric resolution and obtained not only structural information on its constitutive nanolayers but also on the absolute values of the dielectric constant variation in a nanometric scale. By relating the measured profile of the static dielectric constant to the profile of the refractive index in the visible range, combined with optical reflectance measurements and simulation, we were able to describe the origin of the strongly iridescent wing colors of this Amazonian rainforest damselfly. The method we demonstrate here should be useful for the study of other nanostructured biological systems.

scholarly journals Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

2009 ◽  
Vol 106 (2) ◽  
pp. 024315 ◽  
Author(s):  
C. Riedel ◽  
R. Arinero ◽  
Ph. Tordjeman ◽  
M. Ramonda ◽  
G. Lévêque ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Double Pass ◽  
Force Microscopy

Determining the Static Dielectric Constant of Individual Hemoglobin Molecules by Electrostatic Force Microscopy

2019 ◽  
Vol 45 (10) ◽  
pp. 981-983 ◽  
Author(s):  
N. A. Davletkildeev ◽  
D. V. Sokolov ◽  
E. Yu. Mosur ◽  
A. A. Lopandina ◽  
V. V. Bolotov
Keyword(s):  
Dielectric Constant ◽  
Electrostatic Force ◽  
Static Dielectric Constant ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Mapping the local dielectric constant of a biological nanostructured system

2021 ◽  
Vol 12 ◽  
pp. 139-150
Author(s):  
Wescley Walison Valeriano ◽  
Rodrigo Ribeiro Andrade ◽  
Juan Pablo Vasco ◽  
Angelo Malachias ◽  
Bernardo Ruegger Almeida Neves ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Structural Information ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Visible Range ◽  
Force Microscopy ◽  
Nanostructured Systems ◽  
Measured Profile ◽  
Amazonian Rainforest ◽  
Reflectance Measurements

The aim of this work is to determine the varying dielectric constant of a biological nanostructured system via electrostatic force microscopy (EFM) and to show how this method is useful to study natural photonic crystals. We mapped the dielectric constant of the cross section of the posterior wing of the damselfly Chalcopteryx rutilans with nanometric resolution. We obtained structural information on its constitutive nanolayers and the absolute values of their dielectric constant. By relating the measured profile of the static dielectric constant to the profile of the refractive index in the visible range, combined with optical reflectance measurements and simulation, we were able to describe the origin of the strongly iridescent wing colors of this Amazonian rainforest damselfly. The method we demonstrate here should be useful for the study of other biological nanostructured systems.

scholarly journals Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric Films: A Theoretical Model

2015 ◽  
Vol 2015 ◽  
pp. 1-6 ◽  
Author(s):  
E. Castellano-Hernández ◽  
G. M. Sacha
Keyword(s):  
Thin Film ◽  
Dielectric Constant ◽  
Electrostatic Force ◽  
Dielectric Films ◽  
Effective Dielectric Constant ◽  
Electrostatic Force Microscopy ◽  
Finite Conductivity ◽  
Dielectric Thin Film ◽  
Force Microscopy ◽  
Thin Dielectric Films

A study of the electrostatic force between an Electrostatic Force Microscope tip and a dielectric thin film with finite conductivity is presented. By using the Thomas-Fermi approximation and the method of image charges, we calculate the electrostatic potential and force as a function of the thin film screening length, which is a magnitude related to the amount of free charge in the thin film and is defined as the maximum length that the electric field is able to penetrate in the sample. We show the microscope’s signal on dielectric films can change significantly in the presence of a finite conductivity even in the limit of large screening lengths. This is particularly relevant in determining the effective dielectric constant of thin films from Electrostatic Force Microscopy measurements. According to our model, for example, a small conductivity can induce an error of more than two orders of magnitude in the determination of the dielectric constant of a material. Finally, we suggest a method to discriminate between permittivity and conductivity effects by analyzing the dependence of the signal with the tip-sample distance.

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