scholarly journals Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

2009 ◽  
Vol 106 (2) ◽  
pp. 024315 ◽  
Author(s):  
C. Riedel ◽  
R. Arinero ◽  
Ph. Tordjeman ◽  
M. Ramonda ◽  
G. Lévêque ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Double Pass ◽  
Force Microscopy

scholarly journals Mapping the local dielectric constant of a bio‑nanostructured system

2020 ◽  
Author(s):  
Wescley Walison Valeriano ◽  
Rodrigo Ribeiro Andrade ◽  
Juan Pablo Vasco ◽  
Angelo Malachias ◽  
Bernardo Ruegger Almeida Neves ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Cross Section ◽  
Structural Information ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Visible Range ◽  
Force Microscopy ◽  
Measured Profile ◽  
Amazonian Rainforest ◽  
Reflectance Measurements

  The aim of this work is to determine the dielectric constant value of a bio-nanostructured system via Electrostatic Force Microscopy (EFM) and to show how this method is useful to study natural photonic crystals. We mapped the dielectric constant of the cross-section of the posterior wing of the damselfly Chalcopteryx rutilans with nanometric resolution and obtained not only structural information on its constitutive nanolayers but also on the absolute values of the dielectric constant variation in a nanometric scale. By relating the measured profile of the static dielectric constant to the profile of the refractive index in the visible range, combined with optical reflectance measurements and simulation, we were able to describe the origin of the strongly iridescent wing colors of this Amazonian rainforest damselfly. The method we demonstrate here should be useful for the study of other nanostructured biological systems.

Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

2010 ◽  
Vol 96 (18) ◽  
pp. 183107 ◽  
Author(s):  
L. Fumagalli ◽  
G. Gramse ◽  
D. Esteban-Ferrer ◽  
M. A. Edwards ◽  
G. Gomila
Keyword(s):  
Dielectric Constant ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

Determination of work function in the individual carbon nanotubes using electrostatic force microscopy

2015 ◽  
Vol 161 ◽  
pp. 534-537 ◽  
Author(s):  
Nadim A. Davletkildeev ◽  
Denis V. Stetsko ◽  
Valery V. Bolotov ◽  
Yury A. Stenkin ◽  
Petr M. Korusenko ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Work Function ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
The Individual

Determination of Charge on Asphaltene Nanoaggregates in Air Using Electrostatic Force Microscopy

Langmuir ◽  
2015 ◽  
Vol 31 (2) ◽  
pp. 679-684 ◽  
Author(s):  
Ravi Gaikwad ◽  
Aharnish Hande ◽  
Siddhartha Das ◽  
Sushanta K. Mitra ◽  
Thomas Thundat
Keyword(s):  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy
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