Island films resulting from ion bombardment: Spectroscopic ellipsometry and Auger electron spectroscopy

Michael J. Armstrong; Rolf H. Muller

doi:10.1063/1.342698

Island films resulting from ion bombardment: Spectroscopic ellipsometry and Auger electron spectroscopy

Journal of Applied Physics ◽

10.1063/1.342698 ◽

1989 ◽

Vol 65 (8) ◽

pp. 3056-3060 ◽

Cited By ~ 3

Author(s):

Michael J. Armstrong ◽

Rolf H. Muller

Keyword(s):

Auger Electron Spectroscopy ◽

Spectroscopic Ellipsometry ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Bombardment ◽

Island Films

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Effect of ion bombardment at low energy on (100)InP surfaces, studied by auger electron spectroscopy

Surface Science Letters ◽

10.1016/0167-2584(85)90757-1 ◽

1985 ◽

Vol 160 (2) ◽

pp. L519-L523

Author(s):

B. Achard ◽

B. Gruzza ◽

C. Pariset

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Bombardment ◽

Low Energy

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Studies of surface composition of Ag‐Au, Au‐Cu, and Ag‐Cu alloys after ion bombardment by Auger electron spectroscopy

Journal of Applied Physics ◽

10.1063/1.323879 ◽

1977 ◽

Vol 48 (4) ◽

pp. 1404-1407 ◽

Cited By ~ 32

Author(s):

G. Betz ◽

P. Braun ◽

W. Färber

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Ion Bombardment ◽

Cu Alloys

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Effect of ion bombardment at low energy on (100)InP surfaces, studied by Auger electron spectroscopy

Surface Science ◽

10.1016/0039-6028(85)90776-9 ◽

1985 ◽

Vol 160 (2) ◽

pp. L519-L523 ◽

Cited By ~ 14

Author(s):

B. Achard ◽

B. Gruzza ◽

C. Pariset

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Bombardment ◽

Low Energy

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Adhesion enhancement of magnetron-sputtered copper films by ion bombardment etching treatment of nickel and Inconel substrates: investigations by Auger electron spectroscopy and secondary ion mass spectroscopy of the ion beam effects

Journal of Adhesion Science and Technology ◽

10.1163/156856191x00891 ◽

1991 ◽

Vol 5 (11) ◽

pp. 987-999 ◽

Cited By ~ 5

Author(s):

M. Cahoreau ◽

G.H. Lee ◽

J. Caisso ◽

M. Cailler

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Beam ◽

Ion Bombardment ◽

Copper Films ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Interaction of oxygen with an AISI 314 stainless steel surface studied by ellipsometry and auger electron spectroscopy in combination with ion bombardment

Corrosion Science ◽

10.1016/0010-938x(83)90102-6 ◽

1983 ◽

Vol 23 (3) ◽

pp. 195-204 ◽

Cited By ~ 13

Author(s):

G.J. Stokkers ◽

A. van Silfhout ◽

G.A. Bootsma ◽

T. Fransen ◽

P.J. Gellings

Keyword(s):

Stainless Steel ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Steel Surface ◽

Ion Bombardment ◽

Stainless Steel Surface

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An Auger electron spectroscopy-secondary ion mass spectrometry study of layers of Cu-Ni and Ag-Au alloys modified by ion bombardment

Thin Solid Films ◽

10.1016/0040-6090(79)90025-7 ◽

1979 ◽

Vol 63 (2) ◽

pp. 263-268 ◽

Cited By ~ 12

Author(s):

Masao Yabumoto ◽

Hiroshi Kakibayashi ◽

Mamoru Mohri ◽

Kuniaki Watanabe ◽

Toshiro Yamashina

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Ion Bombardment ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface compositions of solid and liquid indium-tin alloys by auger electron spectroscopy using ion bombardment

Journal of Solid State Chemistry ◽

10.1016/0022-4596(86)90132-5 ◽

1986 ◽

Vol 64 (2) ◽

pp. 134-140 ◽

Cited By ~ 3

Author(s):

Masaharu Komiyama ◽

Hiroyuki Tsukamoto ◽

Yoshisada Ogino

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Bombardment ◽

Tin Alloys ◽

Liquid Indium

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3076. Studies of surface composition of AgAu, AuCu, and AgCu alloys after ion bombardment by Auger electron spectroscopy

Vacuum ◽

10.1016/s0042-207x(77)80542-3 ◽

1977 ◽

Vol 27 (12) ◽

pp. 659

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Ion Bombardment

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Auger electron spectroscopy of dentin: elemental quantification and the effects of electron and ion bombardment

Dental Materials ◽

10.1016/0109-5641(93)90075-2 ◽

1993 ◽

Vol 9 (4) ◽

pp. 280-285 ◽

Cited By ~ 12

Author(s):

R.G. Miller ◽

C.Q. Bowles ◽

J.D. Eick ◽

P.L. Gutshall

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Bombardment

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Spectroscopic ellipsometry characterization of anodic films on aluminium correlated with transmission electron microscopy and Auger electron spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.740190183 ◽

1992 ◽

Vol 19 (1-12) ◽

pp. 445-449 ◽

Cited By ~ 21

Author(s):

J. De Laet ◽

H. Terryn ◽

J. Vereecken ◽

J. Vanhellemont

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Spectroscopic Ellipsometry ◽

Electron Spectroscopy ◽

Auger Electron ◽

Anodic Films ◽

Transmission Electron

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