Implementation of differential phase contrast Lorentz microscopy on a conventional transmission electron microscope

1988 ◽  
Vol 64 (10) ◽  
pp. 6011-6013 ◽  
Author(s):  
I. R. McFadyen
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Phase Contrast ◽  
Lorentz Microscopy ◽  
Differential Phase ◽  
Transmission Electron ◽  
Differential Phase Contrast ◽  
Conventional Transmission Electron Microscope

User Access to Lorentz Microscopy at the NCEM, LBNL, Berkeley.

1998 ◽  
Vol 4 (S2) ◽  
pp. 472-473
Author(s):  
K. Verbist ◽  
C. Nelson ◽  
K. Krishnan
Keyword(s):  
Electron Microscope ◽  
Phase Contrast ◽  
Limited Range ◽  
Objective Lens ◽  
Image Filter ◽  
Lorentz Microscopy ◽  
Differential Phase ◽  
Free Sample ◽  
User Access ◽  
Differential Phase Contrast

A standard Philips CM200FEG electron microscope, without the special Lorentz lens, has been optimized for Lorentz imaging. The necessary field-free sample region is obtained by switching off the objective lens in the free lens mode. The limited range of magnification is compensated for by a post-column Gatan image filter (GIF) which magnifies by a factor of _ 20. Fresnel imaging is performed by defocusing with the diffraction lens. The use of low angle diffraction, in combination with the apertures located at the selected area aperture plane, allow Foucault imaging. The TEM analog of differential phase contrast (DPC) imaging has been implemented. This method makes it possible to obtain quantitave induction maps of the in-plane magnetization. TEM DPC is based on a series of Foucault images, recorded with different incremental beam tilts, which are processed to yield images equivalent to the quadrant signals obtained by the STEM DPC technique.

Magnetic Material Observation Assembly for Tem with a Eucentric Goniometer

1976 ◽  
Vol 34 ◽  
pp. 540-541
Author(s):  
K. Shi rota ◽  
A. Yonezawa ◽  
K. Shibatomi ◽  
T. Yanaka
Keyword(s):  
Magnetic Material ◽  
Electron Microscope ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Correction Of Astigmatism ◽  
Single Orientation ◽  
Conventional Transmission Electron Microscope

As is well known, it is not so easy to operate a conventional transmission electron microscope for observation of magnetic materials. The reason is that the instrument requires re-alignment of the axis and re-correction of astigmatism after each specimen shift, as the lens field is greatly disturbed by the specimen. With a conventional electron microscope, furthermore, it is impossible to observe magnetic domains, because the specimen is magnetized to single orientation by the lens field. The above mentioned facts are due to the specimen usually being in the lens field. Thus, special techniques or systems are usually required for magnetic material observation (especially magnetic domain observation), for example, the technique to switch off the objective lens current and Lorentz microscopy. But these cannot give high image quality and wide magnification range, and furthermore Lorentz microscopy is very complicated.

Fabrication of a Boersch phase plate for phase contrast imaging in a transmission electron microscope

2006 ◽  
Vol 77 (3) ◽  
pp. 033701 ◽  
Author(s):  
K. Schultheiß ◽  
F. Pérez-Willard ◽  
B. Barton ◽  
D. Gerthsen ◽  
R. R. Schröder
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Phase Plate ◽  
Contrast Imaging ◽  
Transmission Electron

Electrostatic potential imaging of phase-separated structures in organic materials via differential phase contrast scanning transmission electron microscopy

Microscopy ◽  
2020 ◽  
Vol 69 (5) ◽  
pp. 304-311
Author(s):  
Shin Inamoto ◽  
Satoru Shimomura ◽  
Yuji Otsuka
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electrostatic Potential ◽  
Scanning Transmission Electron Microscopy ◽  
Phase Contrast ◽  
Organic Materials ◽  
Differential Phase ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Differential Phase Contrast

Abstract Electron staining is generally performed prior to observing organic materials via transmission electron microscopy (TEM) to enhance image contrast. However, electron staining can deteriorate organic materials. Here, we demonstrate electrostatic potential imaging of organic materials via differential phase contrast (DPC) scanning transmission electron microscopy (STEM) without electron staining. Electrostatic potential imaging drastically increases the contrast between different materials. Phase-separated structures in a poly (3-hexylthiophene) (P3HT) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) blend that are impossible to observe using conventional STEM are clearly visualized. Furthermore, annealing behavior of the phase-separated structures is directly observed. The morphological transformations in the samples are consistent with their physical parameters, including their glass transition and melting temperatures. Our results indicate that electrostatic potential imaging is highly effective for observing organic materials.

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