A theoretical analysis of Auger recombination induced energetic carrier leakage in GaInAsP/InP double heterojunction lasers and light emitting diodes
Keyword(s):
2009 ◽
Vol 54
(6)
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pp. 2373-2377
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2020 ◽
Vol 11
(21)
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pp. 9371-9378
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2006 ◽
Vol 21
(5)
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pp. 598-603
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