scholarly journals Strength and elastic moduli of TiN from radial x-ray diffraction under nonhydrostatic compression up to 45 GPa

2010 ◽  
Vol 107 (11) ◽  
pp. 113503 ◽  
Author(s):  
Haihua Chen ◽  
Fang Peng ◽  
Ho-kwang Mao ◽  
Guoyin Shen ◽  
Hanns-Peter Liermann ◽  
...  
2013 ◽  
Vol 113 (3) ◽  
pp. 033507 ◽  
Author(s):  
Lun Xiong ◽  
Jing Liu ◽  
Ligang Bai ◽  
Yanchun Li ◽  
Chuanlong Lin ◽  
...  

2008 ◽  
Vol 1139 ◽  
Author(s):  
Klaus Martinschitz ◽  
Rostislav Daniel ◽  
Christian Mitterer ◽  
Keckes Jozef

AbstractA new X-ray diffraction technique to determine elastic moduli of polycrystalline thin films deposited on monocrystalline substrates is demonstrated. The technique is based on the combination of sin2ψ and X-ray diffraction wafer curvature techniques which are used to characterize X-ray elastic strains and macroscopic stress in thin film. The strain measurements must be performed for various hkl reflections. The stresses are determined from the substrate curvature applying the Stoney's equation. The stress and strain values are used to calculate hkl reflection dependent X-ray elastic moduli. The mechanical elastic moduli can be then extrapolated from X-ray elastic moduli considering film macroscopic elastic anisotropy. The derived approach shows for which reflection and corresponding value of the X-ray anisotropic factor Γ the X-ray elastic moduli are equal to their mechanical counterparts in the case of fibre textured cubic polycrystalline aggregates. The approach is independent of the crystal elastic anisotropy and depends on the fibre texture type, the texture sharpness, the amount of randomly oriented crystallites and on the supposed grain interaction model. The new method is demonstrated on a fiber textured Cu thin film deposited on monocrystalline Si(100) substrate. The advantage of the new technique remains in the fact that moduli are determined non-destructively, using a static diffraction experiment and represent volume averaged quantities.


2013 ◽  
Vol 749 ◽  
pp. 643-647 ◽  
Author(s):  
Lei Li ◽  
Ya Feng Lu ◽  
Wen Xue Li ◽  
Li Ying Zeng ◽  
Yi Yang ◽  
...  

Ti-6Al-4V films were deposited by direct-current magnetron sputtering at different substrate temperatures. The structure and the surface morphology of the films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The hardness and elastic moduli of Ti-6Al-4V films were measured by nanoindentation test. The results showed that the phase direction of the films deposited at room temperature was (102) orientation, and turned to almost complete (002) preferred orientation at 300°C. For a higher temperature of 500°C, the preferred orientation of the film disappeared and presented a random grain orientation. The hardness and elastic moduli of Ti-6Al-4V films obviously showed the dependence on the temperature. The relationships among temperature, microstructure and mechanical properties of Ti-6Al-4V films were discussed in this paper.


2007 ◽  
Vol 561-565 ◽  
pp. 1435-1440 ◽  
Author(s):  
Masahiko Ikeda ◽  
Tsuyoshi Miyazaki ◽  
Satoshi Doi ◽  
Michiharu Ogawa

Phase constitution in the solution-treated and quenched state and the heat treatment behavior were investigated by electrical resistivity, hardness, and elastic modulus measurements, X-ray diffraction, and optical microscopy. Hexagonal martensite and the β phase were identified in the Zr-5mass%Nb alloy. β and ω phases were identified in the Zr-10 and 15mass%Nb alloys, and only the β phase was identified in the Ti-20Nb alloy. Resistivity at RT, Vickers hardness and elastic modulus increased up to 10Nb and then decreased dramatically at 15Nb. Above 15Nb, these values slightly decreased. The elastic moduli for 15Nb and 20Nb were 59.5 and 55.5 GPa, respectively. On isochronal heat treatment, the isothermal ω phase precipitated between 473 and 623 K and then the α phase precipitated in the 10Nb, 15Nb and 20Nb alloys.


2002 ◽  
Vol 16 (03) ◽  
pp. 79-85
Author(s):  
Y. PURUSHOTHAM ◽  
O. P. THAKUR ◽  
CHANDRA PRAKASH ◽  
P. VENUGOPAL REDDY

A series of ferroelectric ceramics with the compositional formula PbZr0.52Ti0.48O3 + x wt% of Nb2O5 were prepared by the solid state reaction method. Samples were characterized by studying their X-ray diffraction and dielectric measurements. The longitudinal and shear wave velocities and corresponding elastic moduli were determined at room temperature by using the pulse transmission technique. The values of Young's modulus (E), and the rigidity (n) and bulk (k) moduli were corrected to theoretical density and were found to increase with increasing dopant concentration. The variation of elastic moduli and other elastic parameters such as Debye temperature (θ D ) with composition are explained qualitatively.


Sign in / Sign up

Export Citation Format

Share Document