Low defect-mediated reverse-bias leakage in (0001) GaN via high-temperature molecular beam epitaxy
2011 ◽
Vol 85
(5)
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pp. 737-743
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Keyword(s):
2002 ◽
Vol 122
(1-2)
◽
pp. 37-39
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Keyword(s):
2005 ◽
Vol 286
◽
pp. 150-153