Interpretation of dc characteristics of phosphorus‐doped polycrystalline silicon films: Conduction across low‐barrier grain boundaries
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2001 ◽
Vol 40
(Part 2, No. 2A)
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pp. L97-L99
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1977 ◽
Vol 20
(11)
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pp. 925-930
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2019 ◽
Vol 11
(5)
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pp. 5554-5560
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