Interface structures during solid‐phase‐epitaxial growth in ion implanted semiconductors and a crystallization model

1982 ◽  
Vol 53 (12) ◽  
pp. 8607-8614 ◽  
Author(s):  
J. Narayan
1982 ◽  
Vol 93 (1-2) ◽  
pp. 179-184 ◽  
Author(s):  
J.S. Williams ◽  
F.M. Adams ◽  
K.G. Rossiter

1981 ◽  
Vol 10 ◽  
Author(s):  
J. S. Williams ◽  
F. M. Adams ◽  
K. G. Rossiter

High resolution ion channelling and reflection electron diffraction techniques have been used to examine details of epitaxial regrowth in Ar+-ion-implanted GaAs(100) at furnace anneal temperatures of 400°C or less. In particular, we have investigated the nature and extent of epitaxial regrowth during both isothermal and isochronal annealing for various implant energies and for implant doses above and below the amorphous threshold. Our results indicate the development of a nonplanar growth interface during annealing which may lead, ultimately, to complex near-surface crystallization processes. Consistently with our observations and recent results from other laboratories, we propose a model for the epitaxial regrowth of amorphous GaAs layers based upon non-uniform growth rates along the amorphous-crystalline interface which could arise from local stoichiometry imbalance.


2009 ◽  
Vol 38 (9) ◽  
pp. 1926-1930 ◽  
Author(s):  
N.G. Rudawski ◽  
L.R. Whidden ◽  
V. Craciun ◽  
K.S. Jones

1993 ◽  
Vol 95-98 ◽  
pp. 989-994 ◽  
Author(s):  
M. Taniwaki ◽  
M. Yanaba ◽  
Toshimasa Yoshiie ◽  
Yasunori Hayashi

1990 ◽  
Vol 67 (9) ◽  
pp. 4036-4041 ◽  
Author(s):  
Masafumi Taniwaki ◽  
Hideto Koide ◽  
Naoto Yoshimoto ◽  
Toshimasa Yoshiie ◽  
Somei Ohnuki ◽  
...  

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