Characteristics of 80 keV positive ion source for Large Helical Device

2010 ◽  
Vol 81 (2) ◽  
pp. 02B116 ◽  
Author(s):  
H. Nakano ◽  
M. Osakabe ◽  
K. Tsumori ◽  
M. Sato ◽  
M. Shibuya ◽  
...  
Keyword(s):  
Ion Source ◽  
Positive Ion

How to select the best condition for operating a positive ion source of molecular beam surface ionization typea)

1994 ◽  
Vol 65 (5) ◽  
pp. 1766-1769 ◽  
Author(s):  
Hiroyuki Kawano ◽  
Katsushi Ohgami ◽  
Kiyohiko Funato ◽  
Junji Nakamura
Keyword(s):  
Molecular Beam ◽  
Ion Source ◽  
Surface Ionization ◽  
Beam Surface ◽  
Positive Ion

Ammonia in the Ion-Source. III. Clustering With N-Oxides, Sulfoxides and Sulfones

1986 ◽  
Vol 39 (12) ◽  
pp. 2161 ◽  
Author(s):  
RG Gillis
Keyword(s):  
Chemical Ionization ◽  
Low Pressure ◽  
Ion Source ◽  
Unimolecular Decomposition ◽  
Positive Ion

Under positive ion chemical ionization conditions, with ammonia as reagent gas at relatively low pressure, N-oxides, sulfoxides and sulfones form clusters with a proton and one or more ammonia molecules; these clusters can be represented as [M+H]+, [M+NH4]+, [M+N2H7]+, [2M+H]+ and [2M+NH4]+. The unimolecular decomposition of the clusters can be followed by the accompanying metastable peaks.

How to select the best condition for operating a positive ion source of molecular beam surface ionization type (abstract)a)

1994 ◽  
Vol 65 (4) ◽  
pp. 1398-1398
Author(s):  
Hiroyuki Kawano ◽  
Katsushi Ohgami ◽  
Kiyohiko Funato ◽  
Junji Nakamura
Keyword(s):  
Molecular Beam ◽  
Ion Source ◽  
Surface Ionization ◽  
Beam Surface ◽  
Positive Ion

scholarly journals Ion?Molecule Reactions and Mobilities of SF3+ and SF5+ Ions in SF6 Gas

1993 ◽  
Vol 46 (6) ◽  
pp. 799 ◽  
Author(s):  
ZA Talib ◽  
M Saporoschenko
Keyword(s):  
Field Strength ◽  
Electric Field ◽  
Electric Field Strength ◽  
Drift Tube ◽  
Ion Source ◽  
Zero Field ◽  
Number Density ◽  
Mobility Data ◽  
Ion Molecule Reactions ◽  
Positive Ion

Positive ion-molecule reactions in 8F6 were studied in a static drift-tube mass spectrometer using electron impact at 100 eY as the ion source. The ratio of electric field strength to gas number density, E / N, was typically varied from 40-282 Td and pressure ranged from 0�1 to o� 8 Torr. The most important processes were found to be 8Ft + SF6 ---+ 8Ft + 8F6 + F2 and 8Ft + 8F6 ---+ (82Fg)+* ---+ 82Ft + F 2. The interaction potentials for the 8Ft and 8Ft ions in SF6 were also found by using the measured mobility data which were obtained using a pulsed-ion transit-time method. We found that the (12,4, a* = 0�1) core model was adequate to describe the mobility over the range of E / N studied. The zero-field reduced mobilities for 8Ft and 8Ft were determined to be 0�68 and 0�55cm2y-1 s- 1 respectively.

A Universal Negative or Positive Ion Source

1979 ◽  
Vol 26 (3) ◽  
pp. 3708-3712 ◽  
Author(s):  
G. D. Alton
Keyword(s):  
Ion Source ◽  
Positive Ion

Selection of the residual gas pressure suitable for operating a positive ion source of thermal ionization type

1998 ◽  
Vol 69 (2) ◽  
pp. 1182-1184 ◽  
Author(s):  
Hiroyuki Kawano ◽  
Keiko Ogasawara ◽  
Hajime Kobayashi ◽  
Akihide Tanaka ◽  
Tomoko Takahashi ◽  
...  
Keyword(s):  
Ion Source ◽  
Gas Pressure ◽  
Thermal Ionization ◽  
Residual Gas ◽  
Positive Ion ◽  
Selection Of
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