TIME-RESOLVED TEMPERATURE MEASUREMENTS OF SHOCK INITIATION IN HETEROGENEOUS EXOTHERMIC MIXTURES

2009 ◽  
Author(s):  
F. X. Jetté ◽  
S. Goroshin ◽  
A. J. Higgins ◽  
D. L. Frost ◽  
J. J. Lee ◽  
...  
Keyword(s):  
Temperature Measurements ◽  
Time Resolved ◽  
Shock Initiation

TIME-RESOLVED TEMPERATURE MEASUREMENTS OF SHOCK INITIATION IN A MANGANESE-SULFUR MIXTURE

2008 ◽  
Author(s):  
F. X. Jetté ◽  
S. Goroshin ◽  
A. J. Higgins ◽  
Mark Elert ◽  
Michael D. Furnish ◽  
...  
Keyword(s):  
Temperature Measurements ◽  
Time Resolved ◽  
Shock Initiation

scholarly journals Time-Resolved On-Axis Spectroscopic Stagnation Temperature Measurements in Shock Tunnel Flows

2019 ◽  
Vol 3 (2) ◽  
pp. 6
Author(s):  
Hartmut Borchert ◽  
Stefan Brieschenk ◽  
Berthold Sauerwein
Keyword(s):  
Shock Tunnel ◽  
Temperature Measurements ◽  
Stagnation Temperature ◽  
Time Resolved

Time-Resolved Micro-Raman Thermometry for Microsystems in Motion

2008 ◽  
Vol 130 (12) ◽  
Author(s):  
Justin R. Serrano ◽  
Sean P. Kearney
Keyword(s):  
Microelectromechanical Systems ◽  
Diagnostic Technique ◽  
Temperature Measurements ◽  
Transient Temperature ◽  
Raman Signal ◽  
Periodic Signal ◽  
Fast Time ◽  
Time Resolved ◽  
Microelectromechanical Devices ◽  
Reliable Temperature

Micro-Raman thermometry has been demonstrated to be a feasible technique for obtaining surface temperatures with micron-scale spatial resolution for microelectronic and microelectromechanical systems (MEMSs). However, the intensity of the Raman signal emerging from the probed device is very low and imposes a requirement of prolonged data collection times in order to obtain reliable temperature information. This characteristic currently limits Raman thermometry to steady-state conditions and thereby prevents temperature measurements of transient and fast time-scale events. In this paper, we discuss the extension of the micro-Raman thermometry diagnostic technique to obtain transient temperature measurements on microelectromechanical devices with 100 μs temporal resolution. Through the use of a phase-locked technique we are able to obtain temperature measurements on electrically powered MEMS actuators powered with a periodic signal. Furthermore, we demonstrate a way of obtaining reliable temperature measurements on micron-scale devices that undergo mechanical movement during the device operation.

Time‐resolved temperature measurements during pulsed laser irradiation using thin film metal thermometers

1993 ◽  
Vol 64 (9) ◽  
pp. 2615-2623 ◽  
Author(s):  
D. P. Brunco ◽  
J. A. Kittl ◽  
C. E. Otis ◽  
P. M. Goodwin ◽  
Michael O. Thompson ◽  
...  
Keyword(s):  
Thin Film ◽  
Laser Irradiation ◽  
Pulsed Laser ◽  
Temperature Measurements ◽  
Time Resolved ◽  
Pulsed Laser Irradiation

scholarly journals Multichord time resolved electron temperature measurements by the X-ray absorber foil method on TFTR

1987 ◽  
Vol 27 (3) ◽  
pp. 397-406 ◽  
Author(s):  
J. Kiraly ◽  
M. Bitter ◽  
P. Efthimion ◽  
S. Von Goeler ◽  
B. Grek ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Temperature Measurements ◽  
Time Resolved ◽  
X Ray
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