Raman and Fourier transform infrared study of substitutional carbon incorporation in rapid thermal chemical vapor deposited Si1−x−yGexCy on (1 0 0) Si
1996 ◽
Vol 14
(3)
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pp. 1702
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1995 ◽
Vol 13
(3)
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pp. 607-613
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1989 ◽
Vol 161
(1)
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pp. 47-49
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1981 ◽
Vol 83
(2)
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pp. 558-568
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2006 ◽
Vol 100
(5)
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pp. 4107-4113
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1982 ◽
Vol 4
(2)
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pp. 131-145
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