Charge trapping studies in SiO2using high current injection from Si‐rich SiO2films
1992 ◽
Vol 39
(7)
◽
pp. 1558-1563
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Keyword(s):
1987 ◽
Vol 34
(11)
◽
pp. 2379-2379
Keyword(s):
1984 ◽
Vol 20
(4)
◽
pp. 394-399
◽
Keyword(s):