Breakdown of silicon particle detectors under proton irradiation

2009 ◽  
Vol 106 (10) ◽  
pp. 104914 ◽  
Author(s):  
S. Väyrynen ◽  
J. Räisänen ◽  
I. Kassamakov ◽  
E. Tuominen
1999 ◽  
Vol 78 (1-3) ◽  
pp. 527-532 ◽  
Author(s):  
U. Biggeri ◽  
C. Canali ◽  
C. Lanzieri ◽  
C. Leroy ◽  
F. Nava ◽  
...  

Author(s):  
M. Dragicevic ◽  
U. Bartl ◽  
T. Bergauer ◽  
E. Frühwirth ◽  
S. Gamerith ◽  
...  

Author(s):  
L.F. Makarenko ◽  
F.P. Korshunov ◽  
S.B. Lastovski ◽  
S.B. Lastovskii ◽  
N.M. Kazuchits ◽  
...  

2006 ◽  
Vol 53 (2) ◽  
pp. 589-594 ◽  
Author(s):  
M. Scaringella ◽  
D. Menichelli ◽  
A. Candelori ◽  
R. Rando ◽  
M. Bruzzi

2005 ◽  
Vol 483-485 ◽  
pp. 1025-1028 ◽  
Author(s):  
Nikita B. Strokan ◽  
Alexander M. Ivanov ◽  
N.S. Savkina ◽  
Alexander A. Lebedev ◽  
Vitalii V. Kozlovski ◽  
...  

Nuclear-particle detectors based on SiC with a structure composed of an n+-type substrate, a p-type epitaxial layer, and a Schottky barrier are studied. Structures with a ~10-µm-thick 6H-SiC layer exhibit transistor properties, whereas those with a ~30-µm-thick 4H-SiC layer exhibit diode properties. It is established that a more than tenfold amplification of the signal is observed in the transistor-type structure. The amplification is retained after irradiation with 8-MeV protons with a dose of at least 5 × 10 13 cm –2 ; in this case, the resolution is ≤ 10%. Amplification of the signal was not observed in the structures of diode type. However, there were diode-type detectors with a resolution of ≈ 3%, which is acceptable for a number of applications, even after irradiation with the highest dose of 2 × 10 14 cm.


2002 ◽  
Vol 49 (4) ◽  
pp. 1750-1755 ◽  
Author(s):  
B. MacEvoy ◽  
A. Santocchia ◽  
G. Hall ◽  
F. Moscatelli ◽  
D. Passeri ◽  
...  

Sensors ◽  
2019 ◽  
Vol 19 (15) ◽  
pp. 3388 ◽  
Author(s):  
Ceponis ◽  
Badokas ◽  
Deveikis ◽  
Pavlov ◽  
Rumbauskas ◽  
...  

Wide bandgap AlGaN is one of the most promising materials for the fabrication of radiation hard, double-response particle detectors for future collider facilities. However, the formation of defects during growth and fabrication of AlGaN-based devices is unavoidable. Furthermore, radiation defects are formed in detector structures during operation at extreme conditions. In this work, study of evolution of the proton-induced luminescence spectra and short-circuit current has been simultaneously performed during 1.6 MeV proton irradiation. GaN and AlGaN (with various Al concentrations) epi-layers grown by metalorganic chemical vapour deposition technique and Schottky diode structures have been examined. Variations of spectral and electrical parameters could be applied for the remote dosimetry of large hadron fluences.


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