scholarly journals Time-dependent analysis of low VDD program operation in double-gate SONOS memories by full-band Monte Carlo simulation

2009 ◽  
Vol 106 (10) ◽  
pp. 104506
Author(s):  
G. Giusi ◽  
G. Iannaccone ◽  
U. Ravaioli
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Time Dependent ◽  
Double Gate ◽  
Full Band ◽  
Time Dependent Analysis

scholarly journals Study of Warm-Electron Injection in Double-Gate SONOS by Full-Band Monte Carlo Simulation

2008 ◽  
Vol 29 (11) ◽  
pp. 1242-1244 ◽  
Author(s):  
G. Giusi ◽  
G. Iannaccone ◽  
M. Mohamed ◽  
U. Ravaioli
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Injection ◽  
Double Gate ◽  
Full Band

Mixed Efficient Global Optimization for Time-Dependent Reliability Analysis

2015 ◽  
Vol 137 (5) ◽  
Author(s):  
Zhen Hu ◽  
Xiaoping Du
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Global Optimization ◽  
Reliability Analysis ◽  
Surrogate Model ◽  
Extreme Value ◽  
Time Dependent ◽  
Efficient Global Optimization ◽  
Highly Nonlinear ◽  
Adaptive Kriging

Time-dependent reliability analysis requires the use of the extreme value of a response. The extreme value function is usually highly nonlinear, and traditional reliability methods, such as the first order reliability method (FORM), may produce large errors. The solution to this problem is using a surrogate model of the extreme response. The objective of this work is to improve the efficiency of building such a surrogate model. A mixed efficient global optimization (m-EGO) method is proposed. Different from the current EGO method, which draws samples of random variables and time independently, the m-EGO method draws samples for the two types of samples simultaneously. The m-EGO method employs the adaptive Kriging–Monte Carlo simulation (AK–MCS) so that high accuracy is also achieved. Then, Monte Carlo simulation (MCS) is applied to calculate the time-dependent reliability based on the surrogate model. Good accuracy and efficiency of the m-EGO method are demonstrated by three examples.

Monte Carlo simulation of time-dependent, transport-limited fluorescent boundary measurements in frequency domain

2007 ◽  
Vol 34 (4) ◽  
pp. 1298-1311 ◽  
Author(s):  
Tianshu Pan ◽  
John C. Rasmussen ◽  
Jae Hoon Lee ◽  
Eva M. Sevick-Muraca
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Frequency Domain ◽  
Time Dependent ◽  
Boundary Measurements ◽  
Dependent Transport
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