A new dual-purpose ultrahigh vacuum infrared spectroscopy apparatus optimized for grazing-incidence reflection as well as for transmission geometries

2009 ◽  
Vol 80 (11) ◽  
pp. 113108 ◽  
Author(s):  
Y. Wang ◽  
A. Glenz ◽  
M. Muhler ◽  
Ch. Wöll
Keyword(s):  
Infrared Spectroscopy ◽  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
Dual Purpose

Ultrahigh‐vacuum four‐circle diffractometer for grazing incidence x‐ray diffraction on in situ MBE grown III‐V semiconductor surfaces

1989 ◽  
Vol 60 (7) ◽  
pp. 2369-2372 ◽  
Author(s):  
P. Claverie ◽  
J. Massies ◽  
R. Pinchaux ◽  
M. Sauvage‐Simkin ◽  
J. Frouin ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
Semiconductor Surfaces ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Grazing-angle reflectivity setup for the low-temperature infrared spectroscopy of two-dimensional systems

2019 ◽  
Vol 26 (6) ◽  
pp. 1945-1950
Author(s):  
Marine Verseils ◽  
Alexandre Voute ◽  
Benjamin Langerome ◽  
Maxime Deutsch ◽  
Jean-Blaise Brubach ◽  
...  
Keyword(s):  
Thin Film ◽  
Infrared Spectroscopy ◽  
Synchrotron Radiation ◽  
Low Temperature ◽  
Ultrathin Films ◽  
Grazing Angle ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
Electron Systems ◽  
Dimensional Electron

A new optical setup is described that allows the reflectivity at grazing incidence to be measured, including ultrathin films and two-dimensional electron systems (2DES) down to liquid-helium temperatures, by exploiting the Berreman effect and the high brilliance of infrared synchrotron radiation. This apparatus is well adapted to detect the absorption of a 2DES of nanometric thickness, namely that which forms spontaneously at the interface between a thin film of LaAlO3 and its SrTiO3 substrate, and to determine its Drude parameters.

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