On the analysis of x‐ray‐diffraction line profiles from small epitaxial binary diffusion couples: Determination of concentration profile and influence of TDS

1978 ◽  
Vol 49 (9) ◽  
pp. 4770-4775 ◽  
Author(s):  
R. Delhez ◽  
E. J. Mittemeijer
Keyword(s):  
Concentration Profile ◽  
Diffraction Line ◽  
Line Profiles ◽  
Diffusion Couples ◽  
X Ray Diffraction ◽  
Binary Diffusion ◽  
X Ray

Application of the method of moments to X-ray diffraction line profiles from paracrystals: Native cellulose fibres

1981 ◽  
Vol 14 (6) ◽  
pp. 421-431 ◽  
Author(s):  
G. B. Mitra ◽  
P. S. Mukherjee
Keyword(s):  
Method Of Moments ◽  
Diffraction Line ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
Cellulose Fibres ◽  
Distortion Parameter ◽  
X Ray ◽  
Central Moments ◽  
Two Parameters

The `microparacrystallite size' and `distortion parameter' of delignified ramie, hemp and jute have been determined – with the assumption that these materials are paracrystalline in nature – with the second and fourth central moments of X-ray diffraction line profiles. A new method of curvature correction has been developed. Background as well as non-additivity corrections have also been accounted for. Theories of determining the `microparacrystallite size' and the `distortion parameter' from single reflections independently from each of these two central moments have been developed, and described. Determination of these two parameters for several directions in the samples studied have been based on the above work. It has been shown that, in conformity with the recent findings of Hosemann & Balta Calleja [Ber. Bunsenges. Phys. Chem. (1980), 84, 91], the larger the paracrystalline distortion the smaller is the `microparacrystallite size'.

Correction for errors in microstrain values from X-ray diffraction line profiles

1977 ◽  
Vol 36 (5) ◽  
pp. 1261-1264 ◽  
Author(s):  
H. De Keijser ◽  
E. J. Mittemeijer
Keyword(s):  
Diffraction Line ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
X Ray

In-Situ Studies of X-Ray Diffraction Line Profiles from Strained Copper Foils

2001 ◽  
Vol 378-381 ◽  
pp. 254-261 ◽  
Author(s):  
Robert W. Cheary ◽  
C.C. Tang ◽  
P.A. Lynch ◽  
M.A. Roberts ◽  
S.M. Clark
Keyword(s):  
Diffraction Line ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Studies ◽  
Copper Foils
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