Approximating the transient response of double-heterojunction devices

1978 ◽  
Vol 49 (4) ◽  
pp. 2435 ◽  
Author(s):  
C. G. Fonstad ◽  
C. A. Armiento
1992 ◽  
Vol 282 ◽  
Author(s):  
F. Ren ◽  
C. R. Abernathy ◽  
S. J. Pearton ◽  
P. W. Wisk ◽  
R. Esagui

Carbon-doped base InGaP/GaAs single and double heterojunction bipolar transistors (HBTs) grown by gas-source Metal Organic Molecular Beam Epitaxy (MOMBE) are reported. Large are devices (emitter diameter 70 μm) exhibited gain of 25 for high injection levels at a base doping of 5 × 1019 cm−3. Ideality factors (<1.1)were obtained for both emitter-base and base-collector junctions in both single (SHBT) and double PHBT) heterojunction devices. Vceo's of 12 V and 19 V for SHBTs and DHBTs respectively were measured.


1996 ◽  
Vol 74 (S1) ◽  
pp. 239-242 ◽  
Author(s):  
W. R. McKinnon ◽  
S. P. McAlister ◽  
Z. Abid ◽  
E. E. Guzzo ◽  
S. Laframboise

The dc and rf characteristics for InP/InGaAs heterojunction bipolar transistors having a single heterojunction design were measured and compared with those for double heterojunction devices that employ a composite collector. Although the composite-collector design improves the breakdown characteristics of our devices the rf performance was not as good. This we partially attribute to the collector heterojunction, which causes "current blocking".


2012 ◽  
Vol 43 (01) ◽  
Author(s):  
A Franz ◽  
O Granert ◽  
M Rijntjes ◽  
HR Siebner ◽  
C Weiller ◽  
...  

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