Role of copper in light induced minority-carrier lifetime degradation of
          silicon

H. Savin; M. Yli-Koski; A. Haarahiltunen

doi:10.1063/1.3250161

Role of copper in light induced minority-carrier lifetime degradation of silicon

Applied Physics Letters ◽

10.1063/1.3250161 ◽

2009 ◽

Vol 95 (15) ◽

pp. 152111 ◽

Cited By ~ 42

Author(s):

H. Savin ◽

M. Yli-Koski ◽

A. Haarahiltunen

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime

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Evidence for the role of hydrogen in the stabilization of minority carrier lifetime in boron-doped Czochralski silicon

Applied Physics Letters ◽

10.1063/1.4919385 ◽

2015 ◽

Vol 106 (17) ◽

pp. 173501 ◽

Cited By ~ 37

Author(s):

N. Nampalli ◽

B. Hallam ◽

C. Chan ◽

M. Abbott ◽

S. Wenham

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Czochralski Silicon ◽

Boron Doped

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Minority carrier lifetime in mid-wavelength infrared InAs/InAsSb superlattices: Photon recycling and the role of radiative and Shockley-Read-Hall recombination mechanisms

Applied Physics Letters ◽

10.1063/1.4902022 ◽

2014 ◽

Vol 105 (19) ◽

pp. 193510 ◽

Cited By ~ 28

Author(s):

L. Höglund ◽

D. Z. Ting ◽

A. Soibel ◽

A. Fisher ◽

A. Khoshakhlagh ◽

...

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Photon Recycling

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The Role of Grown-In Defects in Silicon Minority Carrier Lifetime Degradation During Thermal Treatment in Epitaxial Growth Chambers

IEEE Journal of Photovoltaics ◽

10.1109/jphotov.2020.3008791 ◽

2020 ◽

Vol 10 (5) ◽

pp. 1299-1306

Author(s):

Chuqi Yi ◽

Ned J. Western ◽

Fa-Jun Ma ◽

Anita Ho-Baillie ◽

Stephen P. Bremner

Keyword(s):

Thermal Treatment ◽

Epitaxial Growth ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Growth Chambers

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The role of buffer/kesterite interface recombination and minority carrier lifetime on kesterite thin film solar cells

Materials Research Express ◽

10.1088/2053-1591/3/9/095501 ◽

2016 ◽

Vol 3 (9) ◽

pp. 095501 ◽

Cited By ~ 32

Author(s):

Maykel Courel ◽

J A Andrade-Arvizu ◽

O Vigil-Galán

Keyword(s):

Thin Film ◽

Solar Cells ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Thin Film Solar Cells ◽

Interface Recombination

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Microwave transmission method for measuring minority-carrier lifetime in silicon slices

Electronics Letters ◽

10.1049/el:19710516 ◽

1971 ◽

Vol 7 (25) ◽

pp. 754

Author(s):

R.E. Thomas ◽

V. Makios ◽

S. Ogletree ◽

R. Mckillican

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Transmission Method ◽

Microwave Transmission

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Marked enhancement of the photoresponsivity and minority-carrier lifetime of BaSi2 passivated with atomic hydrogen

Physical Review Materials ◽

10.1103/physrevmaterials.3.065403 ◽

2019 ◽

Vol 3 (6) ◽

Cited By ~ 9

Author(s):

Zhihao Xu ◽

Denis A. Shohonov ◽

Andrew B. Filonov ◽

Kazuhiro Gotoh ◽

Tianguo Deng ◽

...

Keyword(s):

Atomic Hydrogen ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Marked Enhancement

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OCVD Measurement of Ambipolar and Minority Carrier Lifetime in 4H-SiC Devices: Relevance of the Measurement Setup

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3083211 ◽

2021 ◽

pp. 1-7

Author(s):

Giovanna Sozzi ◽

Sergio Sapienza ◽

Roberta Nipoti ◽

Giovanni Chiorboli

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime

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High minority carrier lifetime in amorphous-crystalline silicon heterostructure using triode rf PECVD

2020 47th IEEE Photovoltaic Specialists Conference (PVSC) ◽

10.1109/pvsc45281.2020.9300444 ◽

2020 ◽

Author(s):

Pratish Mahtani ◽

Sara M. Almenabawy ◽

Rajiv Prinja ◽

Geetu Sharma ◽

Nazir P. Kherani

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Crystalline Silicon ◽

Minority Carrier Lifetime

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Behavior of Photo Induced Minority Carrier Lifetime in PN Junction with Different Bias Voltages

Energy Procedia ◽

10.1016/j.egypro.2015.12.303 ◽

2015 ◽

Vol 84 ◽

pp. 110-117 ◽

Cited By ~ 1

Author(s):

T. Sameshima ◽

M. Hasumi

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Pn Junction

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Use of transient capacitance measurements for direct determination of minority‐carrier lifetime in low‐doped metal‐oxide‐semiconductor structures

Applied Physics Letters ◽

10.1063/1.95008 ◽

1984 ◽

Vol 45 (1) ◽

pp. 52-53 ◽

Cited By ~ 2

Author(s):

U. Efron ◽

P. O. Braatz

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Direct Determination ◽

Minority Carrier Lifetime ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Capacitance Measurements ◽

Semiconductor Structures ◽

Transient Capacitance

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