A study of two‐stage ion‐beam optics

1978 ◽  
Vol 49 (2) ◽  
pp. 517-524 ◽  
Author(s):  
Jinchoon Kim ◽  
J. H. Whealton ◽  
Gerd Schilling
Keyword(s):  
Ion Beam ◽  
Beam Optics ◽  
Two Stage

Experimental study of ion beam optics in a two‐stage accelerator

1979 ◽  
Vol 50 (2) ◽  
pp. 201-206 ◽  
Author(s):  
Jinchoon Kim ◽  
W. L. Gardner ◽  
M. M. Menon
Keyword(s):  
Experimental Study ◽  
Ion Beam ◽  
Beam Optics ◽  
Two Stage

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

Intense light ion beam divergence in single- and two-stage diodes

1993 ◽  
Vol 21 (5) ◽  
pp. 567-572 ◽  
Author(s):  
S. Miyamoto ◽  
K. Yasuike ◽  
N. Shirai ◽  
K. Imasaki ◽  
C. Yamanaka ◽  
...  
Keyword(s):  
Ion Beam ◽  
Beam Divergence ◽  
Two Stage ◽  
Intense Light

A Blazed Si Grating for Soft X-Ray Fabricated by Two-Stage Reactive Ion-Beam Etching

1983 ◽  
Vol 22 (Part 2, No. 4) ◽  
pp. L219-L220 ◽  
Author(s):  
Hiroaki Aritome ◽  
Toshiya Yamato ◽  
Shinji Matsui ◽  
Susumu Namba
Keyword(s):  
Ion Beam ◽  
Two Stage ◽  
Ion Beam Etching ◽  
X Ray ◽  
Reactive Ion Beam Etching

scholarly journals 14C AMS Measurements of <100 μG Samples with a High-Current System

Radiocarbon ◽  
1997 ◽  
Vol 40 (1) ◽  
pp. 247-253 ◽  
Author(s):  
Karl F. Von Reden ◽  
Ann P. McNichol ◽  
Ann Pearson ◽  
Robert J. Schneider
Keyword(s):  
Current System ◽  
Ion Beam ◽  
Beam Current ◽  
Small Sample ◽  
Small Samples ◽  
High Current ◽  
Beam Optics ◽  
Woods Hole Oceanographic Institution ◽  
Factors Affecting ◽  
The Past

The NOSAMS facility at Woods Hole Oceanographic Institution has started to develop and apply techniques for measuring very small samples on a standard Tandetron accelerator mass spectrometry (AMS) system with high-current hemispherical Cs sputter ion sources. Over the past year, results on samples ranging from 7 to 160 μg C showed both the feasibility of such analyses and the present limitations on reducing the size of solid carbon samples. One of the main factors affecting the AMS results is the dependence of a number of the beam optics parameters on the extracted ion beam current. The extracted currents range from 0.5 to 10 μA of 12C− for the sample sizes given above. We here discuss the setup of the AMS system and methods for reliable small-sample measurements and give the AMS-related limits to sample size and the measurement uncertainties.

The use of micro-computers in the simulation of ion beam optics

Vacuum ◽  
1989 ◽  
Vol 39 (11-12) ◽  
pp. 1043-1046 ◽  
Author(s):  
Peter Spädtke ◽  
Detlef Ivens
Keyword(s):  
Ion Beam ◽  
Beam Optics

Analysis of ionomer distribution in PEFC catalyst layer by two-stage ion-beam processing

2016 ◽  
Vol 2016 (0) ◽  
pp. B122
Author(s):  
Takamasa Koyama ◽  
Takahiro Suzuki ◽  
Shohji Tsushima
Keyword(s):  
Ion Beam ◽  
Catalyst Layer ◽  
Two Stage
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