Experimental study of ion beam optics in a two‐stage accelerator

1979 ◽  
Vol 50 (2) ◽  
pp. 201-206 ◽  
Author(s):  
Jinchoon Kim ◽  
W. L. Gardner ◽  
M. M. Menon
Keyword(s):  
Experimental Study ◽  
Ion Beam ◽  
Beam Optics ◽  
Two Stage

A study of two‐stage ion‐beam optics

1978 ◽  
Vol 49 (2) ◽  
pp. 517-524 ◽  
Author(s):  
Jinchoon Kim ◽  
J. H. Whealton ◽  
Gerd Schilling
Keyword(s):  
Ion Beam ◽  
Beam Optics ◽  
Two Stage

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

Experimental study of pulsed ion beam generated by different pulsing topology in 2.45 GHz ECR proton source

2021 ◽  
Vol 16 (10) ◽  
pp. P10018
Author(s):  
H.M. Kewlani ◽  
S.H. Gharat ◽  
J.V. Mathew ◽  
S.V.L.S. Rao ◽  
P. Roychowdhury ◽  
...  
Keyword(s):  
Experimental Study ◽  
Ion Beam ◽  
Proton Source

Intense light ion beam divergence in single- and two-stage diodes

1993 ◽  
Vol 21 (5) ◽  
pp. 567-572 ◽  
Author(s):  
S. Miyamoto ◽  
K. Yasuike ◽  
N. Shirai ◽  
K. Imasaki ◽  
C. Yamanaka ◽  
...  
Keyword(s):  
Ion Beam ◽  
Beam Divergence ◽  
Two Stage ◽  
Intense Light

scholarly journals Experimental study on a dredged fill ground improved by a two-stage vacuum preloading method

2018 ◽  
Vol 58 (3) ◽  
pp. 766-775 ◽  
Author(s):  
Jun Wang ◽  
Yuanqiang Cai ◽  
Hongtao Fu ◽  
Xiuqing Hu ◽  
Ying Cai ◽  
...  
Keyword(s):  
Experimental Study ◽  
Two Stage ◽  
Vacuum Preloading ◽  
Preloading Method
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