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Role of structural defects in electron transport properties of copper films
Journal of Applied Physics
◽
10.1063/1.323678
◽
1977
◽
Vol 48
(2)
◽
pp. 538-546
◽
Cited By ~ 34
Author(s):
K. L. Chopra
◽
Ritu Suri
◽
A. P. Thakoor
Keyword(s):
Electron Transport
◽
Transport Properties
◽
Structural Defects
◽
Copper Films
◽
Electron Transport Properties
Download Full-text
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Radiation Effect on the Electron Transport Properties of SiO2/Si Interface: Role of Si Dangling-Bond Defects and Oxygen Vacancy
2018 IEEE 2nd International Conference on Dielectrics (ICD)
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◽
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Daomin Min
◽
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Michel Frechette
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The role of the supporting electrolyte ions and additives on the electron transport properties of electrografted films bearing ferrocenyl moieties
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◽
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◽
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◽
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Felipe J Gonzalez-Bravo
◽
Daniel Enrique Ramírez-Chan
◽
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◽
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The Role of Interfaces in Magnetic and Electron Transport Properties of Au/Fe/Cu/Fe/GaAs(001) and Fe/MgO/Fe-Whisker(001) Systems
Physics of Low Dimensional Systems
◽
10.1007/0-306-47111-6_27
◽
2001
◽
pp. 273-283
Author(s):
T. L. Monchesky
◽
A. Enders
◽
R. Urban
◽
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◽
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◽
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Electron Transport
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Role of atomic terraces and steps in the electron transport properties of epitaxial graphene grown on SiC
AIP Advances
◽
10.1063/1.3679400
◽
2012
◽
Vol 2
(1)
◽
pp. 012115
◽
Cited By ~ 18
Author(s):
H. Kuramochi
◽
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◽
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◽
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◽
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◽
...
Keyword(s):
Electron Transport
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Transport Properties
◽
Epitaxial Graphene
◽
Electron Transport Properties
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Electron transport properties of thin copper films. I.
Journal of Applied Physics
◽
10.1063/1.321934
◽
1975
◽
Vol 46
(6)
◽
pp. 2574-2582
◽
Cited By ~ 82
Author(s):
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◽
A. P. Thakoor
◽
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Keyword(s):
Electron Transport
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Radiation Effect on the Electron Transport Properties of SiO2/Si Interface: Role of Si Dangling-Bond Defects and Oxygen Vacancy
2018 IEEE 2nd International Conference on Dielectrics (ICD)
◽
10.1109/icd.2018.8468353
◽
2018
◽
Author(s):
Guanghao Qu
◽
Daomin Min
◽
Zhonghua Zhao
◽
Michel Frechette
◽
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Keyword(s):
Electron Transport
◽
Oxygen Vacancy
◽
Transport Properties
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Radiation Effect
◽
Dangling Bond
◽
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Electron transport properties of copper films. II. Thermoelectric power
Journal of Applied Physics
◽
10.1063/1.321503
◽
1975
◽
Vol 46
(11)
◽
pp. 4777-4783
◽
Cited By ~ 33
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◽
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◽
S. K. Suri
◽
K. L. Chopra
Keyword(s):
Electron Transport
◽
Transport Properties
◽
Thermoelectric Power
◽
Copper Films
◽
Electron Transport Properties
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Electron transport properties of copper films. II. Thermoelectric power
Vacuum
◽
10.1016/s0042-207x(76)81093-7
◽
1976
◽
Vol 26
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◽
pp. 128
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Electron Transport
◽
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◽
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◽
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◽
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Computational Study of Electron Transport Properties in Graphene Nanoribbon and Nanoribbon-based Resonant Tunneling Diodes
2020 11th International Conference on Electrical and Computer Engineering (ICECE)
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◽
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M. T. R. Chowdhury
◽
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◽
Graphene Nanoribbon
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Resonant Tunneling Diodes
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