Electromechanical properties of polarized polyvinylidene fluoride films as studied by the piezoelectric resonance method

1976 ◽  
Vol 47 (3) ◽  
pp. 949-955 ◽  
Author(s):  
Hiroji Ohigashi
Keyword(s):  
Polyvinylidene Fluoride ◽  
Resonance Method ◽  
Electromechanical Properties ◽  
Piezoelectric Resonance

A New Piezoelectric Ceramic Electronic Voltage Transducer and its Principle Design

2011 ◽  
Vol 317-319 ◽  
pp. 992-995
Author(s):  
Ying Jun Sang ◽  
Xue Liang Huang
Keyword(s):  
Piezoelectric Ceramic ◽  
Measurement Accuracy ◽  
Optical Measurement ◽  
Resonance Method ◽  
Voltage Measurement ◽  
Piezoelectric Resonance ◽  
Voltage Transducer ◽  
Self Gravity ◽  
Signal Processing Methods ◽  
The Impact

In this paper, the piezoelectric ceramic electronic voltage transducer principles is researched, a new internal structure of the measurement system is put forward and the signal processing methods are discussed. On the basis of the analysis of freedom cantilever optical measurement methods for the longitudinal piezoelectric deformation, we proposes the piezoelectric resonance method to detect amplitude of piezoelectric ceramic and cleverly designed mechanical structure, in which the lightweight elastic material is used to support the resonance thin film. This structure overcomes the impact of cantilever longitudinal self-gravity and horizontal friction between cantilever and piezoelectric ceramic, and can improve the deformation measurement accuracy. 10kV 0.05 class transducer voltage measurement accuracy is achieved theoretically.

Pressure and temperature dependence of the electromechanical properties of polarized polyvinylidene fluoride films

1984 ◽  
Vol 56 (11) ◽  
pp. 3298-3303 ◽  
Author(s):  
P. Destruel ◽  
F. Soto Rojas ◽  
D. Tougne ◽  
Hoang‐The‐Giam
Keyword(s):  
Temperature Dependence ◽  
Polyvinylidene Fluoride ◽  
Electromechanical Properties

Characterization of RF Sputtered ZnO Piezoelectric Films Using Transmission Electron Microscope

1975 ◽  
Vol 33 ◽  
pp. 86-87
Author(s):  
Kemining W. Yeh ◽  
Richard S. Muller ◽  
Wei-Kuo Wu ◽  
Jack Washburn
Keyword(s):  
Integrated Circuit ◽  
Acoustic Waves ◽  
New Technology ◽  
Surface Acoustic Waves ◽  
Electromechanical Properties ◽  
Leading Role ◽  
Saw Devices ◽  
Transmission Electron ◽  
High Degree

Considerable and continuing interest has been shown in the thin film transducer fabrication for surface acoustic waves (SAW) in the past few years. Due to the high degree of miniaturization, compatibility with silicon integrated circuit technology, simplicity and ease of design, this new technology has played an important role in the design of new devices for communications and signal processing. Among the commonly used piezoelectric thin films, ZnO generally yields superior electromechanical properties and is expected to play a leading role in the development of SAW devices.

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