High current efficiency accelerating lens system of field emission scanning electron microscope

1975 ◽  
Vol 46 (1) ◽  
pp. 454-456 ◽  
Author(s):  
Katsuhiro Kuroda ◽  
Tatsuro Suzuki
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Current Efficiency ◽  
Field Emission ◽  
High Current ◽  
Lens System ◽  
High Current Efficiency ◽  
Scanning Electron

Comparison of freeze-fractured yeast replicas using conventional TEM and low-voltage field-emission SEM

1989 ◽  
Vol 47 ◽  
pp. 74-75
Author(s):  
William P. Wergin ◽  
Eric F. Erbe ◽  
Terrence W. Reilly
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Voltage ◽  
Objective Lens ◽  
Specimen Preparation ◽  
Lens System ◽  
Air Drying ◽  
Preparation Techniques ◽  
Scanning Electron

Although the first commercial scanning electron microscope (SEM) was introduced in 1965, the limited resolution and the lack of preparation techniques initially confined biological observations to relatively low magnification images showing anatomical surface features of samples that withstood the artifacts associated with air drying. As the design of instrumentation improved and the techniques for specimen preparation developed, the SEM allowed biologists to gain additional insights not only on the external features of samples but on the internal structure of tissues as well. By 1985, the resolution of the conventional SEM had reached 3 - 5 nm; however most biological samples still required a conductive coating of 20 - 30 nm that prevented investigators from approaching the level of information that was available with various TEM techniques. Recently, a new SEM design combined a condenser-objective lens system with a field emission electron source.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

A high-current scanning electron microscope with multi-beam optics

2016 ◽  
Vol 159 ◽  
pp. 132-138 ◽  
Author(s):  
Takashi Doi ◽  
Minoru Yamazaki ◽  
Takashi Ichimura ◽  
Yan Ren ◽  
P. Kruit
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Current ◽  
Beam Optics ◽  
Scanning Electron

Effect of Kaolin Particle Size Towards Preparation of Kaolin Ceramic Membrane

2021 ◽  
Vol 02 (01) ◽  
Author(s):  
Siti Khadijah Hubadillah ◽  
◽  
Norsiah Hami ◽  
Nurul Azita Salleh ◽  
Mohd Riduan Jamalludin ◽  
...  
Keyword(s):  
Particle Size ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Preliminary Data ◽  
Membrane Structure ◽  
Ceramic Membrane ◽  
Low Cost ◽  
Dense Structure ◽  
Scanning Electron

The purpose of this work is to study the effect of kaolin particle size for the preparation of low cost ceramic membrane suspension and ceramic membrane structure. Kaolin particle size is categorized into two categories; i) ≤ 1µm and ii) ≥ 1 µm. The suspension is prepared via stirring technique under 1000 rpm at 60°C. The particle size of kaolin is characterized using field emission scanning electron microscope (FESEM) and the prepared suspension is characterized in term of its viscosity. Results indicate that the particle size gave significant effect to the viscosity of ceramic membrane suspension. Preliminary data showed that kaolin with particle size ≤ 1µm resulted ceramic membrane with dense structure.

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