On the extraction of interface trap density in the Pt/La2O3/Ge gate stack and the determination of the charge neutrality level in Ge

2009 ◽  
Vol 105 (12) ◽  
pp. 124521 ◽  
Author(s):  
D. Bozyigit ◽  
C. Rossel
Keyword(s):  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Gate Stack ◽  
Charge Neutrality ◽  
Charge Neutrality Level

Simple method for the determination of the interface trap density at 77 K in fully depleted accumulation mode SOI MOSFETs

1993 ◽  
Vol 36 (6) ◽  
pp. 827-832 ◽  
Author(s):  
J.A. Martino ◽  
E. Simoen ◽  
U. Magnusson ◽  
A.L.P. Rotondaro ◽  
C. Claeys
Keyword(s):  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Simple Method ◽  
Fully Depleted ◽  
Accumulation Mode
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