Making a commercial atomic force microscope more accurate and faster using positive position feedback control
2009 ◽
Vol 80
(6)
◽
pp. 063705
◽
Keyword(s):
Keyword(s):
2004 ◽
Vol 237
(1-4)
◽
pp. 650-652
◽
2012 ◽
Vol 19
(10)
◽
pp. 1538-1560
◽
2015 ◽
Vol 24
(3)
◽
pp. 035007
◽
Keyword(s):
Keyword(s):
Keyword(s):