Electrical stress-induced charge carrier generation/trapping related degradation of HfAlO/SiO2 and HfO2/SiO2 gate dielectric stacks

2009 ◽  
Vol 105 (12) ◽  
pp. 124507 ◽  
Author(s):  
Piyas Samanta ◽  
Chin-Lung Cheng ◽  
Yao-Jen Lee ◽  
Mansun Chan
Keyword(s):  
Charge Carrier ◽  
Gate Dielectric ◽  
Carrier Generation ◽  
Electrical Stress ◽  
Induced Charge

On the Photo-Induced Charge-Carrier Generation within Monolayers of Self-Assembled Organic Donor-Acceptor Dyads

2014 ◽  
Vol 26 (37) ◽  
pp. 6416-6422 ◽  
Author(s):  
Franz Fuchs ◽  
Mathieu Linares ◽  
Christiaan de Vet ◽  
Philippe Leclère ◽  
Renaud Demadrille ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Carrier Generation ◽  
Donor Acceptor ◽  
Induced Charge ◽  
Self Assembled

Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in Silicon

2015 ◽  
Vol 62 (4) ◽  
pp. 1550-1557 ◽  
Author(s):  
Joel M. Hales ◽  
Ani Khachatrian ◽  
Nicolas J-H. Roche ◽  
Jeffrey Warner ◽  
Stephen P. Buchner ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Photon Absorption ◽  
Carrier Generation ◽  
Two Photon Absorption ◽  
Two Photon ◽  
Induced Charge

Polarization-induced charge carrier separation in polar and nonpolar grown GaN quantum dots

2009 ◽  
Vol 106 (8) ◽  
pp. 083707 ◽  
Author(s):  
Oliver Marquardt ◽  
Tilmann Hickel ◽  
Jörg Neugebauer
Keyword(s):  
Quantum Dots ◽  
Charge Carrier ◽  
Induced Charge ◽  
Carrier Separation

Photoconduction in poly(3-alkylthiophene) I. Charge carrier generation

1992 ◽  
Vol 47 (1) ◽  
pp. 77-86 ◽  
Author(s):  
N.T. Binh ◽  
M. Gailberger ◽  
H. Bässler
Keyword(s):  
Charge Carrier ◽  
Carrier Generation

scholarly journals Impact of Hydrogen Bonds Limited Dipolar Disorder in High-k Polymer Gate Dielectric on Charge Carrier Transport in OFET

Polymers ◽  
2020 ◽  
Vol 12 (4) ◽  
pp. 826
Author(s):  
Bartosz Paruzel ◽  
Jiří Pfleger ◽  
Jiří Brus ◽  
Miroslav Menšík ◽  
Francesco Piana ◽  
...  
Keyword(s):  
Hydrogen Bonds ◽  
Charge Carrier ◽  
Charge Transport ◽  
Density Of States ◽  
Dielectric Layer ◽  
Carrier Transport ◽  
Gate Dielectric ◽  
Field Effect Transistors ◽  
Semiconductor Layer ◽  
High K

The paper contributes to the characterization and understanding the mutual interactions of the polar polymer gate dielectric and organic semiconductor in organic field effect transistors (OFETs). It has been shown on the example of cyanoethylated polyvinylalcohol (CEPVA), the high-k dielectric containing strong polar side groups, that the conditions during dielectric layer solidification can significantly affect the charge transport in the semiconductor layer. In contrast to the previous literature we attributed the reduced mobility to the broader distribution of the semiconductor density of states (DOS) due to a significant dipolar disorder in the dielectric layer. The combination of infrared (IR), solid-state nuclear magnetic resonance (NMR) and broadband dielectric (BDS) spectroscopy confirmed the presence of a rigid hydrogen bonds network in the CEPVA polymer. The formation of such network limits the dipolar disorder in the dielectric layer and leads to a significantly narrowed distribution of the density of states (DOS) and, hence, to the higher charge carrier mobility in the OFET active channel made of 6,13-bis(triisopropylsilylethynyl)pentacene. The low temperature drying process of CEPVA dielectric results in the decreased energy disorder of transport states in the adjacent semiconductor layer, which is then similar as in OFETs equipped with the much less polar poly(4-vinylphenol) (PVP). Breaking hydrogen bonds at temperatures around 50 °C results in the gradual disintegration of the stabilizing network and deterioration of the charge transport due to a broader distribution of DOS.

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